Systems and methods for testing RFID straps

• US 9,857,413 B2
• Filed: 12/29/2014
• Issued: 01/02/2018
• Est. Priority Date: 07/02/2014
• Status: Active Grant

• Current Assignee: Avery Dennison Retail Information Services LLC (Avery Dennison Corporation)
• Original Assignee: Avery Dennison Retail Information Services LLC (Avery Dennison Corporation)
• Inventors: Farr, Adrian N., Forster, Ian James
• Primary Examiner(s): Le, Son
• Assistant Examiner(s): SHAH, NEEL D
• Application Number:
  US14/584,545
• Publication Number:
  US 20160003898A1
• Time in Patent Office: 1,100 Days
• CPC Class Codes: G01R 31/2822 of microwave or radiofrequency circuits of attenuation, gain, e.g. using network analyzers G01R27/28

Abstract

Systems and methods provided for testing remote frequency identification (RFID) straps on a web. Testing system includes a test head having a pair of contact pins configured to be moved toward the web (or configured to make contact with web moved towards them) and into contact with the web or RFID strap. Conveyor continuously moves the web to move individual RFID straps into and out of alignment with the test head. Controller causes the contact pins to move toward the web at a frequency that'"'"'s greater than the frequency at which the conveyor moves consecutive RFID straps into alignment with the test head. Alternatively or additionally, the test head may have a mount formed of a compliant material that allows at least a portion of the test head to deflect while the contact pins are in contact with a continuously moving RFID strap, thereby maintaining contact between contact pins and strap.

Claims

1. A system for testing RFID straps on a web, comprising:

a test head including a pair of contact pins configured to be moved toward the web and into contact with the web or an RFID strap on the web;

a conveyor configured to continuously move the web so as to move individual RFID straps into and out of alignment with the test head; and

a controller programmed to control movement of the contact pins and the conveyor, with the controller causing the contact pins to be moved toward the web at a frequency that is greater than the frequency at which the conveyor moves consecutive RFID straps into alignment with the test head.

2. The system of claim 1, further comprising a second test head including a pair of contact pins configured to be moved toward the web and into contact with the web or an RFID strap on the web.

3. The system of claim 2, wherein the test heads are configured to test different electrical properties of the RFID straps.

4. The system of claim 2, wherein the controller is programmed to synchronize movement of the contact pins of the test heads.

5. The system of claim 1, wherein the controller is programmed to control movement of the contact pins so as to move the contact pins into contact with each RFID strap multiple times.

6. A method of testing RFID straps on a web, comprising:

continuously moving a web including a plurality of RFID straps; and

periodically moving a pair of contact pins toward the web and into contact with the web or an individual RFID strap on the web, wherein the contact pins are moved toward the web at a frequency that is greater than the frequency at which consecutive RFID straps on the web are moved into alignment with the contact pins.

7. The method of claim 6, wherein said periodically moving a pair of contact pins includes periodically moving a second pair of contact pins toward the web and into contact with the web or an RFID strap on the web.

8. The method of claim 7, wherein the pairs of contact pins are configured to test different electrical properties of the RFID straps.

9. The method of claim 7, wherein the periodic movement of the pairs of contact pins is synchronized.

10. The method of claim 6, wherein said periodically moving a pair of contact pins includes moving the contact pins into contact with each RFID strap multiple times.