Selective per-cycle masking of scan chains for system level test

• US 9,874,606 B2
• Filed: 06/21/2016
• Issued: 01/23/2018
• Est. Priority Date: 12/20/2007
• Status: Active Grant

• Current Assignee: Siemens Industry Software Limited (Siemens AG)
• Original Assignee: Mentor Graphics Corporation (Siemens AG)
• Inventors: Rajski, Janusz, Czysz, Dariusz, Mrugalski, Grzegorz, Mukherjee, Nilanjan
• Primary Examiner(s): BRITT, CYNTHIA H
• Application Number:
  US15/188,786
• Publication Number:
  US 20170052227A1
• Time in Patent Office: 581 Days
• CPC Class Codes: G01R 31/31703 Comparison aspects, e.g. signature analysis, comparators concerning scan tests G01R31/318566; concerning testers G01R31/3193
• CPC Class Codes: G01R 31/31723 Hardware for routing the test signal within the device under test to the circuits to be tested, e.g. multiplexer for multiple core testing, accessing internal nodes routing the test signal to or from the device under test G01R31/31926
• CPC Class Codes: G01R 31/31724 Test controller, e.g. BIST state machine for scan test G01R31/318555
• CPC Class Codes: G01R 31/3177 Testing of logic operation, e.g. by logic analysers
• CPC Class Codes: G01R 31/318547 Data generators or compressors
• CPC Class Codes: G06F 11/27 Built-in tests

Abstract

Built-in self-test techniques for integrated circuits that address the issue of unknown states. Some implementations use a specialized scan chain selector coupled to a time compactor. The presence of the specialized scan chain selector increases the efficiency in masking X states. Also disclosed are: (1) an architecture of a selector that works with multiple scan chains and time compactors, (2) a method for determining and encoding per cycle scan chain selection masks used subsequently to suppress X states, and (3) a method to handle an over-masking phenomenon.

Claims

1. One or more non-transitory machine-readable storage media storing computer-readable instructions that when executed by a computer, cause the computer to perform a method, the instructions comprising:

instructions for generating mask data indicating patterns of unknown states for which to mask test responses received from scan cells in an integrated circuit;

instructions for storing the mask data in a memory of the integrated circuit;

instructions for providing a selector configured to mask test responses produced by the scan cells based on the stored mask data, thereby producing masked test responses; and

instructions for providing a test response compactor configured to receive the masked test responses.

2. The machine-readable storage media of claim 1, wherein the generating mask data comprises mapping a pattern of the received test responses to one or more fault propagation sites designated among the scan cells.

3. The machine-readable storage media of claim 1, wherein the generating the mask data comprises selecting one or more of the scan cells based on the number of times an unknown state reaches the scan cells, the number of times faults are observed at the scan cells, or the number of times an unknown state reaches the scan cells and the number of times faults are observed at the scan cells, through a series of the received test responses.

4. One or more non-transitory machine-readable storage media storing computer-readable instructions that when executed by a computer, cause the computer to perform a method, the instructions comprising:

instructions for generating mask data indicating patterns of unknown states for which to mask test responses received from scan cells in an integrated circuit;

instructions for causing the mask data to be stored in a memory of the integrated circuit;

instructions for configuring a selector to mask test responses produced by the scan cells based on the stored mask data, thereby producing masked test responses, the selector comprising;

a shadow register configured to capture and save one or more outputs of a ring generator for more than one clock cycle, and

logic for determining whether to load the shadow register with the outputs of the ring generator based on control information merged with the stored mask data; and

instructions for configuring a test response compactor to receive the masked test responses.

5. The machine-readable storage media of claim 4, wherein the generating mask data comprises mapping a pattern of the received test responses to one or more fault propagation sites designated among the scan cells.

6. The machine-readable storage media of claim 4, wherein the generating the mask data comprises selecting one or more of the scan cells based on the number of times an unknown state reaches the scan cells, the number of times faults are observed at the scan cells, or the number of times an unknown state reaches the scan cells and the number of times faults are observed at the scan cells, through a series of the received test responses.

7. The machine-readable storage media of claim 4, wherein:

the scan cells are error-capturing scan cells;

the masked test responses mask one or more unknown states in test responses produced by the error-capturing scan cells; and

the method further comprises generating the mask data, the mask data indicating scan cell locations to mask in the produced test responses by masking patterns of unknown states.

8. The machine-readable storage media of claim 4, wherein the integrated circuit comprises:

a circuit-under-test comprising the scan cells;

the memory storing the mask data, the mask data indicating one or more of the scan cells to mask in scan cell test responses by masking patterns of unknown states in the test responses;

the provided selector, the selector being configured to mask the received test responses responsive to the mask data, producing the masked test responses; and

the provided compactor, the compactor operable to receive the masked test responses.

9. One or more non-transitory machine-readable storage media storing computer-readable instructions that when executed by a computer, cause the computer to perform a method, the instructions comprising:

instructions for providing a test response compactor configured to receive masked test responses masking one or more unknown states in test responses produced by error-capturing scan cells;

instructions for providing a selector configured to mask the produced test responses responsive to per-cycle mask data, producing the masked test responses, the selector comprising;

a ring generator, and

a shadow register configured to capture and save one or more outputs of the ring generator for more than one clock cycle, the shadow register being operable independently of the ring generator; and

instructions for generating the per-cycle mask data, the per-cycle mask data indicating scan cell locations to mask in the produced test responses by masking patterns of unknown states.

10. The machine-readable storage media of claim 9, wherein the selector comprises:

a shadow register configured to capture and save one or more outputs of a ring generator for more than one clock cycle; and

logic for determining whether to load the shadow register with the outputs of the ring generator based on control information merged with the mask data.

11. The machine-readable storage media of claim 9, wherein the selector comprises an XOR tree used to reload a shadow register directly from outputs of a ring generator.

12. The machine-readable storage media of claim 9, wherein the generating the mask data comprises selecting one or more of the scan cells based on the number of times an unknown state reaches the scan cells through a series of the produced test responses.

13. The machine-readable storage media of claim 9, wherein the generating the mask data comprises selecting one or more of the scan cell locations based on the number of times faults are observed at the scan cells.

14. The machine-readable storage media of claim 9, wherein the generating the mask data comprises selecting cells to be masked based on a grouping of the scan cells, and further comprising generating the grouping by:

selecting a scan cell C of a list of the scan cells based on observability of a given fault at the scan cell C;

updating the D-histogram accordingly by decreasing entries corresponding to scan cells where faults observed at scan cell C are visible as well;

assigning the selected scan cell C to one of the first test responses where the fault is observed; and

removing faults observed at scan cell C from the list of the scan cells.

15. The machine-readable storage media of claim 9, further comprising instructions for testing an integrated circuit using the selector, the compactor, and the mask data, the integrated circuit including the scan cells.