Optimized lancet tape
First Claim
Patent Images
1. A method for producing an analytical tape designed for being used in an analytical testing device with a sample-taking function, the method comprising:
- providing a supporting tape wound on a first roller;
unwinding the supporting tape from the first roller in a transport direction and subsequently winding the supporting tape onto a second roller in a continuous process;
punching lancets from a lancet tape at a punching station; and
successively applying the lancets directly to the supporting tape at at least one application point between the first and second rollers, wherein each of the plurality of lancets comprises a puncturing component selected from the group consisting of a flat lancet and a round needle, each of the puncturing components being fixed directly on the supporting tape and being oriented pointing in a direction perpendicular to the transport direction, and wherein the combination of the supporting tape and the lancets forms the analytical tape configured having a constant thickness, the constant thickness being increased only at the lancets by the thickness of the lancets.
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Abstract
A method for producing an analytical tape, in particular a lancet tape, is proposed. The analytical tape is designed for being used in an analytical testing device with at least a sample-taking function. In the method, at least one supporting tape is provided in a continuous process. A plurality of lancet elements are successively applied directly to the supporting tape at at least one application point.
17 Citations
38 Claims
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1. A method for producing an analytical tape designed for being used in an analytical testing device with a sample-taking function, the method comprising:
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providing a supporting tape wound on a first roller; unwinding the supporting tape from the first roller in a transport direction and subsequently winding the supporting tape onto a second roller in a continuous process; punching lancets from a lancet tape at a punching station; and successively applying the lancets directly to the supporting tape at at least one application point between the first and second rollers, wherein each of the plurality of lancets comprises a puncturing component selected from the group consisting of a flat lancet and a round needle, each of the puncturing components being fixed directly on the supporting tape and being oriented pointing in a direction perpendicular to the transport direction, and wherein the combination of the supporting tape and the lancets forms the analytical tape configured having a constant thickness, the constant thickness being increased only at the lancets by the thickness of the lancets. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29)
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30. A method for producing an analytical tape designed for being used in an analytical testing device with a sample-taking function, the method comprising:
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providing a supporting tape wound on a first roller; unwinding the supporting tape from the first roller in a transport direction and subsequently winding the supporting tape onto a second roller in a continuous process; aligning a lancet tape relative to the supporting tape using a plurality of positioning aides, the positioning aides being positioned in a predetermined spatial relationship to one or more of a plurality of lancets of the lancet tape; punching the lancets from the lancet tape at a punching station; and successively applying the lancets directly to the supporting tape at at least one application point between the first and second rollers, wherein each of the plurality of lancets comprises a puncturing component selected from the group consisting of a flat lancet and a round needle, each of the puncturing components being fixed directly on the supporting tape and being oriented pointing in a direction perpendicular to the transport direction, and wherein the combination of the supporting tape and the lancets forms the analytical tape configured having a constant thickness, the constant thickness being increased only at the lancets by the thickness of the lancets. - View Dependent Claims (31, 32, 33, 34, 35, 36, 37, 38)
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Specification