Scanner system and method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test
First Claim
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1. A scanner system operable for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test (DUT), the scanner system comprising:
- (a) a probe array comprising a plurality of switched probes, wherein adjacent probes are spaced apart at a predetermined separation distance;
(b) an analyzer connected to the probe array for determining the electromagnetic field level at each probe location based on a signal induced in each probe by the radiated electromagnetic field;
(c) an actuator for changing the relative position of the probe array to the DUT, from a first array position to a second array position;
(d) a computer comprising a processor and a memory, wherein the processor is operatively connected to the analyzer and the actuator, and wherein the memory component stores a set of instructions executable by the processor to implement a method comprising the steps of;
(i) measuring the electromagnetic field level at each probe when the probe array is in the first array position to create a first dataset of electromagnetic field levels at the position of each probe in the probe array when in the first array position;
(ii) controlling the actuator to change the relative position of the probe array to the DUT from the first array position to the second array position; and
(iii) measuring the electromagnetic field level at each probe when the probe array is in the second array position to create a second dataset of electromagnetic field levels at the position of each probe in the probe array when in the second array position.
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Abstract
A scanner system and method operable for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test (DUT) are provided. The electromagnetic field level radiated by the DUT is measured with a probe array comprising a plurality of spatially separated switched probes, an analyzer, and a computer. An actuator changes the relative position of the probe array to the DUT by a distance less than or equal to the separation distance between the probes, and the electromagnetic field level is measured and stored again.
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Citations
20 Claims
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1. A scanner system operable for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test (DUT), the scanner system comprising:
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(a) a probe array comprising a plurality of switched probes, wherein adjacent probes are spaced apart at a predetermined separation distance; (b) an analyzer connected to the probe array for determining the electromagnetic field level at each probe location based on a signal induced in each probe by the radiated electromagnetic field; (c) an actuator for changing the relative position of the probe array to the DUT, from a first array position to a second array position; (d) a computer comprising a processor and a memory, wherein the processor is operatively connected to the analyzer and the actuator, and wherein the memory component stores a set of instructions executable by the processor to implement a method comprising the steps of; (i) measuring the electromagnetic field level at each probe when the probe array is in the first array position to create a first dataset of electromagnetic field levels at the position of each probe in the probe array when in the first array position; (ii) controlling the actuator to change the relative position of the probe array to the DUT from the first array position to the second array position; and (iii) measuring the electromagnetic field level at each probe when the probe array is in the second array position to create a second dataset of electromagnetic field levels at the position of each probe in the probe array when in the second array position. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test (DUT), the method comprising the steps of:
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(a) providing a probe array comprising a plurality of switched probes, wherein adjacent probes are spaced apart at a predetermined separation distance; (b) positioning the probe array relative to the DUT in a first array position; (c) measuring the electromagnetic field level at each probe when the probe array is in the first array position to create a first dataset of electromagnetic field levels at the position of each probe in the probe array when in the first array position; (d) changing the relative position of the probe array to the DUT to a second array position; and (e) measuring the electromagnetic field level at each probe when the probe array is in the second array position to create a second dataset of electromagnetic field levels at the position of each probe in the probe array when in the second array position. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification