Semiconductor integrated circuit

• US 9,880,211 B2
• Filed: 03/02/2016
• Issued: 01/30/2018
• Est. Priority Date: 03/09/2015
• Status: Active Grant

• Current Assignee: Fujitsu Limited
• Original Assignee: Fujitsu Limited
• Inventors: Kawano, Yoichi
• Primary Examiner(s): Hollington, Jermele M
• Assistant Examiner(s): Rhodes-Vivour, Temilade
• Application Number:
  US15/058,757
• Publication Number:
  US 20160266187A1
• Time in Patent Office: 699 Days
• CPC Class Codes: G01R 29/26 Measuring noise figure; Measuring signal-to-noise ratio
• CPC Class Codes: G01R 31/2822 of microwave or radiofrequency circuits of attenuation, gain, e.g. using network analyzers G01R27/28
• CPC Class Codes: G01R 31/2884 using dedicated test connectors, test elements or test circuits on the IC under test G01R31/2855 takes precedence
• CPC Class Codes: H03B 1/00 Details
• CPC Class Codes: H03B 2200/00 Indexing scheme relating to details of oscillators covered by H03B
• CPC Class Codes: H03L 2207/00 Indexing scheme relating to automatic control of frequency or phase and to synchronisation

Abstract

A semiconductor integrated circuit includes a harmonic oscillator circuit, a first switch circuit configured to cause an oscillating state of the harmonic oscillator circuit to switch between an “on” state and an “off” state, a detector circuit configured to produce a voltage responsive to an amplitude of the oscillating output of the harmonic oscillator circuit, a decision circuit configured to detect whether the voltage produced by the detector circuit exceeds a threshold in synchronization with a clock signal, and a second switch circuit configured to control whether or not to apply noise from a noise source to the harmonic oscillator circuit.

Claims

1. A semiconductor integrated circuit, comprising:

a harmonic oscillator circuit;

a first switch circuit configured to cause an oscillating state of the harmonic oscillator circuit to switch between an “

on”

state and an “

off”

state;

a detector circuit configured to produce a voltage responsive to an amplitude of the oscillating output of the harmonic oscillator circuit;

a decision circuit configured to detect whether the voltage produced by the detector circuit exceeds a threshold in synchronization with a clock signal; and

a second switch circuit configured to cause the harmonic oscillator circuit to oscillate in a first state in which noise from a noise source is not applied to the harmonic oscillator circuit, and configured to cause the harmonic oscillator circuit to oscillate in a second state in which noise from the noise source is applied to the harmonic oscillator circuit.

2. The semiconductor integrated circuit as claimed in claim 1, wherein the second switch circuit is configured to control whether to make or break a connection between the noise source and the harmonic oscillator circuit.

3. The semiconductor integrated circuit as claimed in claim 1, wherein the second switch circuit is configured to control whether or not to apply power to the noise source.

4. The semiconductor integrated circuit as claimed in claim 1, wherein the detector circuit is a rectifying circuit, and the decision circuit is a flip-flop.

5. A semiconductor integrated circuit, comprising:

a first noise detecting circuit; and

a second noise detecting circuit,

wherein each of the first noise detecting circuit and the second noise detecting circuit includes;

a harmonic oscillator circuit;

a first switch circuit configured to cause an oscillating state of the harmonic oscillator circuit to switch between an “

on”

state and an “

off”

state;

a detector circuit configured to produce a voltage responsive to an amplitude of the oscillating output of the harmonic oscillator circuit;

a decision circuit configured to detect whether the voltage produced by the detector circuit exceeds a threshold in synchronization with a clock signal; and

a second switch circuit configured to cause the harmonic oscillator circuit to oscillate in a first state in which noise from a noise source is not applied to the harmonic oscillator circuit, and configured to cause the harmonic oscillator circuit to oscillate in a second state in which noise from the noise source is applied to the harmonic oscillator circuit,

wherein an oscillating frequency of the harmonic oscillator circuit of the first noise detecting circuit and an oscillating frequency of the harmonic oscillator circuit of the second noise detecting circuit are different from each other.

6. A method for measuring noise, comprising:

initiating an oscillation of a harmonic oscillator circuit in a first state in which noise from a noise source is not applied to the harmonic oscillator circuit;

measuring, in the first state, a time length from the initiation of the oscillation to a point in time at which an output of the harmonic oscillator circuit first exceeds a predetermined threshold;

initiating an oscillation of the harmonic oscillator circuit in a second state in which noise from the noise source is applied to the harmonic oscillator circuit; and

measuring, in the second state, a time length from the initiation of the oscillation to a point in time at which an output of the harmonic oscillator circuit first exceeds the predetermined threshold.