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Systems, devices and methods related to calibration of a proton computed tomography scanner

  • US 9,880,301 B2
  • Filed: 02/29/2016
  • Issued: 01/30/2018
  • Est. Priority Date: 03/07/2011
  • Status: Expired due to Fees
First Claim
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1. A method of calibrating a computed tomography system, the method comprising:

  • positioning a calibration device to intersect a beam axis of a beam of ions, the calibration device having known water-equivalent thickness (WET) values and comprising a plurality of degrader plates;

    generating first signals in response to interaction between a first ion and a particle detection system, the first ion traversing a first path through the calibration device;

    generating second signals in response to interaction between a second ion and the particle detection system, the second ion traversing a second path through the calibration device, the second path parallel to the first path and offset from the first path in a direction perpendicular to the beam axis;

    determining a first water equivalent path length (WEPL) for the first ion, the first WEPL based on a first WET value for the first path through the calibration device;

    calculating a first reduction in ion energy for the first ion based on the first signals, the first reduction in ion energy due to interaction of the first ion with the calibration device; and

    determining a second water equivalent path length (WEPL) for the second ion, the second WEPL based on a second WET value for the second path through the calibration device;

    calculating a second reduction in ion energy for the second ion based on the second signals, the second reduction in ion energy due to interaction of the second ion with the calibration device; and

    generating a relationship between WEPL and reduction in ion energy based on the first WEPL, the first reduction in ion energy, the second WEPL, and the second reduction in ion energy.

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