Active matrix capacitive sensor for common-mode cancellation

• US 9,880,688 B2
• Filed: 12/18/2015
• Issued: 01/30/2018
• Est. Priority Date: 08/05/2015
• Status: Active Grant

• Current Assignee: Synaptics Incorporated
• Original Assignee: Synaptics Incorporated
• Inventors: Akhavan Fomani, Arash, Smith, Patrick
• Primary Examiner(s): Cheng, Joe H
• Application Number:
  US14/975,042
• Publication Number:
  US 20170038866A1
• Time in Patent Office: 774 Days
• CPC Class Codes: G06F 3/04166 Details of scanning methods, e.g. sampling time, grouping of sub areas or time sharing with display driving Synchronisation with the driving of the display or the backlighting unit to avoid interferences generated internally G06F3/04184
• CPC Class Codes: G06F 3/044 by capacitive means
• CPC Class Codes: G06F 3/0443 using a single layer of sensing electrodes
• CPC Class Codes: G06F 3/047 using sets of wires, e.g. crossed wires

Abstract

This disclosure generally provides an input device that includes a plurality of sensor modules coupled to sensor electrodes arranged in a matrix that measure capacitive sensing signals corresponding to the electrodes. To mitigate the effect of capacitive coupling between a sensor electrode being sensed and its neighbors in the matrix, the input device drives the neighboring electrodes in a same manner as the selected sensor electrode so that there is little or no voltage difference between the sensor electrode being sensed and its neighbors. For example, during a drive phase, the electrode being sensed and the neighboring electrodes are coupled to the same charge voltage. During a read phase, the neighboring electrodes and the selected electrode may be coupled to the same reference voltage—e.g., ground—so there is again no voltage difference between the electrodes.

Claims

1. A processing system for performing capacitive sensing, the processing system comprising:

selection logic configured to apply, during a first time period, a charging voltage to a first sensor electrode and a second sensor electrode, wherein the second sensor electrode neighbors the first sensor electrode in a sensor electrode matrix, wherein the sensor electrode matrix comprises a plurality of sensor electrodes forming rows and columns on a common plane, wherein the plurality of sensor electrodes comprises the first and second sensor electrodes; and

a sensor circuit configured to measure, during a second time period, a first charge stored on the first sensor electrode resulting from applying the charging voltage, wherein the selection logic is configured to bias the second sensor electrode to a reference voltage during the second time period.

2. The processing system of claim 1, wherein a second charge stored on the second sensor electrode resulting from applying the charging voltage during the first time period is not measured by the processing system during the second time period.

3. The processing system of claim 1, wherein there is no voltage difference between the first and second sensor electrodes at the ends of the first and second time periods, and wherein each of the rows and each of the columns contain at least two of the plurality of sensor electrodes.

4. The processing system of claim 1, wherein an amount of the first charge stored on the first sensor electrode is based on a coupling capacitance between the first sensor electrode and an input object.

5. The processing system of claim 1, wherein sensor electrodes in the sensor electrode matrix have a pitch suitable for distinguishing between features of a fingerprint.

6. The processing system of claim 1, wherein the first and second sensor electrodes are in a same row in the sensor electrode matrix.

7. The processing system of claim 1, wherein the selection logic is configured to apply, during the first time period, the charging voltage to a third sensor electrode neighboring the first sensor electrode in the sensor electrode matrix, wherein the processing system further comprises:

a different sensor circuit configured to measure, during the second time period, a third charge stored on the third sensor electrode resulting from applying the charging voltage, wherein the first and third sensor electrodes are in a same row in the sensor electrode matrix.

8. The processing system of claim 7, wherein the sensor circuit is selectively coupled to sensor electrodes in at least two columns in the sensor electrode matrix, wherein the first sensor electrode is selectively coupled to the sensor circuit while the third sensor electrode is selectively coupled to the different sensor circuit and the first and third charges in the first and third sensor electrodes are measured in parallel.

9. The processing system of claim 1, wherein the selection logic is configured to:

bias data lines to the reference voltage during a third time period, wherein the third time period occurs between the first and second time periods, wherein the data lines respectively coupled the first and second sensor electrodes to the selection logic.

10. An input device, comprising:

a plurality of sensor electrodes arranged in a matrix comprising a plurality of sensor electrodes forming rows and columns on a common plane;

a processing system configured to;

apply, during a first time period, a charging voltage to a first sensor electrode of the plurality of sensor electrodes and a second sensor electrode of the plurality of sensor electrodes, wherein the second sensor electrode neighbors the first sensor electrode in the matrix,

measure, during a second time period, a first charge stored on the first sensor electrode resulting from applying the charging voltage, and

bias the second sensor electrode to a reference voltage during the second time period.

11. The input device of claim 10, wherein a second charge stored on the second sensor electrode resulting from applying the charging voltage during the first time period is not measured by the processing system during the second time period.

12. The input device of claim 10, wherein there is no voltage difference between the first and second sensor electrodes at the ends of the first and second time periods.

13. The input device of claim 10, wherein the plurality of sensor electrodes form a fingerprint sensor array, wherein each of the rows and each of the columns contain at least two of the plurality of sensor electrodes.

14. The input device of claim 10, further comprising:

a first row select line configured to activate a first switch coupling the second sensor electrode to the charging voltage; and

a second row select line configured to activate a second switch coupling the second sensor electrode to the reference voltage.

15. The input device of claim 14, wherein the first switch and second switch comprise respective thin-film-transistors (TFT).

16. The input device of claim 14, further comprising:

a third row select line configured to activate a third switch coupling the first sensor electrode to the charging voltage and a sensor circuit; and

a fourth row select line configured to activate a fourth switch coupling the first sensor electrode to the reference voltage, wherein the first and second sensor electrodes are disposed in different rows in the matrix.

17. A method for performing capacitive sensing, the method comprising:

applying, during a first time period, a charging voltage to a first sensor electrode and to a second sensor electrode neighboring the first sensor electrode in a sensor electrode matrix, wherein the sensor electrode matrix comprises a plurality of sensor electrodes forming rows and columns on a common plane, wherein the plurality of sensor electrodes comprises the first and second sensor electrodes;

measuring, during a second time period, a first charge stored on the first sensor electrode resulting from applying the charging voltage; and

biasing the second sensor electrode to a reference voltage during the second time period.

18. The method of claim 17, wherein a second charge stored on the second sensor electrode resulting from applying the charging voltage during the first time period is not measured during the second time period.

19. The method of claim 17, further comprising:

applying, during the first time period, the charging voltage to a third sensor electrode neighboring the first sensor electrode in the sensor electrode matrix; and

measuring, during the second time period, a third charge stored on the third sensor electrode resulting from applying the charging voltage, wherein the first and third sensor electrodes are in a same row in the sensor electrode matrix.

20. The method of claim 17, further comprising:

disconnecting the first and second sensor electrodes from respective data lines coupling the first and second sensor electrodes to a voltage source providing the charging voltage during a third time period, wherein the third time period occurs between the first and second time periods, and wherein the first and second sensor electrodes are electrically floating during the third time period; and

biasing the respective data lines the reference voltage during the third time period.

21. An input device, comprising:

a plurality of sensor electrodes arranged in a matrix;

first and second row select lines selectively coupling first and second sensor electrodes in the matrix to a first data line; and

a processing system configured to;

apply, during a first time period, a charging voltage to the first sensor electrode using the first data line,

apply, during the first time period, the charging voltage to a third sensor electrode in the matrix using a second data line; and

measure, during a second time period, a charge stored on the first sensor electrode resulting from applying the charging voltage using the first data line, wherein the second sensor electrode and third sensor electrode are electrically floating during the second time period.