System and method for extracting correlation curves for an organic light emitting device

• US 9,881,532 B2
• Filed: 05/23/2014
• Issued: 01/30/2018
• Est. Priority Date: 02/04/2010
• Status: Active Grant

• Current Assignee: IGNIS Innovation Incorporated
• Original Assignee: IGNIS Innovation Incorporated
• Inventors: Chaji, Gholamreza
• Primary Examiner(s): Natalini, Jeff
• Application Number:
  US14/286,711
• Publication Number:
  US 20140292342A1
• Time in Patent Office: 1,348 Days
• CPC Class Codes: G09G 2300/0413 Details of dummy pixels or dummy lines in flat panels
• CPC Class Codes: G09G 2320/0285 using tables for spatial correction of display data
• CPC Class Codes: G09G 2320/029 by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
• CPC Class Codes: G09G 2320/043 Preventing or counteracting the effects of ageing
• CPC Class Codes: G09G 2320/045 Compensation of drifts in the characteristics of light emitting or modulating elements
• CPC Class Codes: G09G 2360/145 the light originating from the display screen
• CPC Class Codes: G09G 3/006 Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309
• CPC Class Codes: G09G 3/32 semiconductive, e.g. using light-emitting diodes [LED]
• CPC Class Codes: G09G 3/3291 in which the data driver supplies a variable data voltage for setting the current through, or the voltage across, the light-emitting elements

Abstract

A system for determining the efficiency degradation of an organic light emitting device (OLED) in an array-based semiconductor device having an array of pixels that include OLEDs. The system determines the relationship between changes in an electrical operating parameter of the OLEDs and the efficiency degradation of said OLEDs, for at least one stress condition; measures a change in the electrical operating parameter of the OLEDs; determines the stress condition of at least one pixel or group of pixels in the semiconductor device; and uses the determined relationship and the determined stress condition to determine the efficiency degradation of the OLEDs corresponding to the measured change in the electrical operating parameter of the OLEDs.

Claims

1. A method of determining the efficiency degradation of an organic light emitting device (OLED) in an array-based semiconductor device having an array of pixels that include OLEDs, said method comprising:

electrically driving a first OLED according to a first stress condition, the first OLED substantially similar to said OLED;

periodically measuring with use of a photo sensor and an output of the photo sensor an efficiency degradation of said first OLED, said photo sensor on the array-based semiconductor device and in or next to a first pixel of the array of pixels, said first pixel including said first OLED;

periodically measuring an electrical operating parameter of said first OLED;

determining a first interdependency curve with use of said periodic measurements of the efficiency degradation and the electrical operating parameter of the first OLED;

electrically driving a second OLED according to a second stress condition different from the first stress condition, the second OLED substantially similar to said OLED;

periodically measuring the efficiency degradation and the electrical operating parameter of said second OLED;

determining a second interdependency curve with use of said periodic measurements of the efficiency degradation and the electrical operating parameter of the second OLED;

measuring a change in said electrical operating parameter of said OLED from a baseline of said electrical operating parameter;

determining a stress condition of said OLED; and

using said first and second interdependency curves, said measured change in said electrical operating parameter of said OLED, and said determined stress condition to determine the efficiency degradation of said OLED.

2. The method of claim 1 in which said electrical operating parameter is OLED voltage.

3. The method of claim 1 in which the stress condition of said OLED is determined from the stress history of said OLED.

4. The method of claim 3 in which said stress history is a moving average of the stress conditions to which said OLED is subjected.

5. The method of claim 1 in which the stress condition of said OLED is determined from the rate of change in said electrical operating parameter of said OLED over time as a function of the stress to which said OLED is subjected.

6. The method of claim 1 in which the first and second interdependency curves respectively represent the relationship between changes in an electrical operating parameter of said first OLED from a baseline of said electrical operating parameter and the efficiency degradation of said first OLED and the relationship between changes in an electrical operating parameter of said second OLED from a baseline of said electrical operating parameter and the efficiency degradation of said second OLED.

7. The method of claim 1 wherein said stress condition of said OLED is determined from stress conditions of at least one pixel or group of pixels in said semiconductor device.

8. The method of claim 7 wherein said stress condition of said OLED is determined by interpolation of the stress conditions of the at least one pixel or group of pixels.