Efficient modulated imaging

• US 9,883,803 B2
• Filed: 11/11/2014
• Issued: 02/06/2018
• Est. Priority Date: 11/07/2012
• Status: Active Grant

• Current Assignee: Modulated Imaging, Inc.
• Original Assignee: Modulated Imaging, Inc.
• Inventors: Cuccia, David, Mazhar, Amaan
• Primary Examiner(s): Patton, Amanda
• Assistant Examiner(s): EDWARDS, PHILIP CHARLES
• Application Number:
  US14/538,776
• Publication Number:
  US 20150141839A1
• Time in Patent Office: 1,183 Days
• Field of Search: 600476
• CPC Class Codes: A61B 5/0064 Body surface scanning
• CPC Class Codes: A61B 5/0071 by measuring fluorescence emission
• CPC Class Codes: A61B 5/0077 Devices for viewing the surface of the body, e.g. camera, magnifying lens

Abstract

An apparatus for turbid sample measurement comprising a plurality of light sources for illuminating a turbid sample target area with non-spatial structured light, a projection system for illuminating the turbid sample target area with spatial structured light, a sensor for collecting light from the turbid sample target area, and a processor to analyze the data captured by the sensor to yield scattering and absorption coefficients of the turbid sample. A method comprises illuminating the sample with spatial structured light, collecting light reflected from the sample at a number of wavelengths, illuminating the sample with non-spatial structured light, collecting light reflected from the sample at a number of wavelengths, and combining the measurements of the collected light to obtain the optical properties of the sample and/or the concentration of absorbing or fluorescent molecules. The wavelengths of the spatial and non-spatial light sources are preferably different.

Claims

1. A method for measurement of a turbid sample, the method comprising the steps of:

illuminating with a first light source a target area of the turbid sample with only spatially structured at a plurality of wavelengths and along a first optical projection path,

collecting light reflected from the turbid sample to obtain remitted spatially structured light of the sample at a first plurality of wavelengths, λ

_j,

illuminating with a second light source the target area of the turbid sample with only planar structured light at a plurality of wavelengths and along a second optical projection path, wherein the first optical projection path differs from the second optical projection path,

collecting light reflected from the turbid sample to obtain remitted planar structured light of the sample at a second plurality of wavelengths, λ

_k, and

combining measurements of the remitted spatially structured light and the remitted planar light collected from the turbid sample to obtain fit parameters, wherein the fit parameters include one or more optical properties of the turbid sample at the first and second plurality of wavelengths, λ

_j and λ

_k, and a concentration of absorbing or fluorescent molecules.

2. The method of claim 1, wherein each wavelength of the first plurality of wavelengths, λ

_j, has a different signal to noise ratio (SNR) and wherein each wavelength of the second plurality of wavelengths, λ

_k, has a different signal to noise ratio (SNR).

3. The method of claim 2, wherein the first plurality of wavelengths, λ

_j, differs from the second plurality of wavelengths, λ

_k.

4. The method of claim 3, further comprising, prior to illuminating the target area of the turbid sample with only non-spatially structured light, extrapolating the measurements of the remitted light having spatial structure to calculate a scattering coefficient for the second plurality of wavelengths, μ

′

(λ

_k^P).

5. The method of claim 4, wherein the measurements of the remitted non-spatially structured light are at diffuse reflectance coefficients, Rdλ

k^P.

6. The method of claim 5, wherein μ

′

(λ

_k^P) and Rdλ

k^P are combined to yield μ

_a(λ

_k^P).

7. The method of claim 6, wherein the signal to noise ratios (SNR) of the first plurality of wavelengths, λ

_j, are higher in relation to the signal to noise ratios (SNR) of the second plurality of wavelengths, λ

_k.