Apparatus and method for measuring reference spectrum for sample analysis, and apparatus and method for analyzing sample

• US 9,885,607 B2
• Filed: 08/19/2016
• Issued: 02/06/2018
• Est. Priority Date: 08/24/2015
• Status: Active Grant

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: Eom, Kun Sun
• Primary Examiner(s): Geisel, Kara E
• Assistant Examiner(s): Prieto, Violeta A
• Application Number:
  US15/241,762
• Publication Number:
  US 20170059409A1
• Time in Patent Office: 536 Days
• CPC Class Codes: G01J 2003/2873 Storing reference spectrum
• CPC Class Codes: G01J 2003/425 Reflectance
• CPC Class Codes: G01J 3/027 Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
• CPC Class Codes: G01J 3/10 Arrangements of light sources specially adapted for spectrometry or colorimetry
• CPC Class Codes: G01J 3/28 Investigating the spectrum using colour filters G01J3/51
• CPC Class Codes: G01J 3/42 Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry beam switching arrangements G01J3/08

Abstract

An apparatus for measuring a reference spectrum includes a parameter adjuster configured to adjust a parameter of a spectroscope so that an intensity of a reflection spectrum of a sample has a value in a range, a reference material spectrum measurer configured to adjust reflectance of a reference material so an intensity of a reflection spectrum of the reference material is not saturated, and measure the reflection spectrum of the reference material, using the spectroscope having the adjusted parameter, a first reference spectrum calculator configured to, in response to the adjusted reflectance of the reference material not being one hundred percent, calculate a first reference spectrum based on the measured reflection spectrum of the reference material, and a second reference spectrum measurer configured to measure a second reference spectrum of the reference material, using the spectroscope having the adjusted parameter, when a light source of the spectroscope is turned off.

Claims

1. An apparatus for measuring a reference spectrum for a sample analysis, the apparatus comprising:

a parameter adjuster configured to adjust a parameter of a spectroscope so that an intensity of a reflection spectrum of a sample to be analyzed by the spectroscope has a value in a range;

a reference material spectrum measurer configured to;

adjust reflectance of a reference material so that an intensity of a reflection spectrum of the reference material is not saturated; and

measure the reflection spectrum of the reference material, using the spectroscope having the adjusted parameter;

a first reference spectrum calculator configured to, in response to the adjusted reflectance of the reference material not being one hundred percent, calculate a first reference spectrum based on the measured reflection spectrum of the reference material; and

a second reference spectrum measurer configured to measure a second reference spectrum of the reference material, using the spectroscope having the adjusted parameter, in response to a light source of the spectroscope being turned off.

2. The apparatus of claim 1, wherein the range is determined to maximize a performance of the spectroscope.

3. The apparatus of claim 1, wherein the parameter of the spectroscope comprises at least one of a preamp coefficient of the light source, an integration time of the light source, a scan number of the light source, and a resolution of the light source.

4. The apparatus of claim 1, wherein the reference material comprises a first plate where a fully reflective material is applied, and a second plate where a light-absorbing material is applied as a pattern, the first plate overlapping the second plate to slide together, and

the reference material spectrum measurer is further configured to adjust the reflectance of the reference material through the first plate and the second plate sliding together.

5. The apparatus of claim 1, wherein the reference material comprises a fully reflective material, and a film disposed on the fully reflective material and configured to adjust a transparency of the fully reflective material, and

the reference material spectrum measurer is further configured to adjust the reflectance of the reference material by adjusting the transparency of the film.

6. The apparatus of claim 1, wherein the reference material spectrum measurer is further configured to adjust the reflectance of the reference material by reducing a number of light sources of the spectroscope to be used in the measurement of the reflection spectrum of the reference material, or readjusting the adjusted parameter of the spectroscope.

7. The apparatus of claim 1, wherein the first reference spectrum calculator is further configured to calculate the first reference spectrum, using a conversion formula defining a relation of a spectrum depending on reflectance.

8. A method of measuring a reference spectrum for a sample analysis, the method comprising:

adjusting a parameter of a spectroscope so that an intensity of a reflection spectrum of a sample to be analyzed by the spectroscope has a value in a range;

adjusting reflectance of a reference material so that an intensity of a reflection spectrum of the reference material is not saturated;

measuring the reflection spectrum of the reference material, using the spectroscope having the adjusted parameter;

in response to the adjusted reflectance of the reference material not being one hundred percent, calculating a first reference spectrum based on the measured reflection spectrum of the reference material; and

measuring a second reference spectrum of the reference material, using the spectroscope having the adjusted parameter, in response to a light source of the spectroscope being turned off.

9. The method of claim 8, wherein the range is determined to maximize a performance of the spectroscope.

10. The method of claim 8, wherein the parameter of the spectroscope comprises any one or any combination a preamp coefficient of the light source, an integration time of the light source, a scan number of the light source, and a resolution of the light source.

11. The method of claim 8, wherein the reference material comprises a first plate where a fully reflective material is applied, and a second plate where a light-absorbing material is applied as a pattern, the first plate overlapping the second plate to slide together, and

the adjusting of the reflectance of the reference material comprises adjusting the reflectance of the reference material through the first plate and the second plate sliding together.

12. The method of claim 8, wherein the reference material comprises a fully reflective material, and a film disposed on the fully reflective material and configured to adjust a transparency of the fully reflective material, and

the adjusting of the reflectance of the reference material comprises adjusting the reflectance of the reference material by adjusting the transparency of the film.

13. The method of claim 8, wherein the adjusting of the reflectance of the reference material comprises adjusting the reflectance of the reference material by reducing a number of light sources of the spectroscope to be used in the measurement of the reflection spectrum of the reference material, or readjusting the adjusted parameter of the spectroscope.

14. The method of claim 8, wherein the calculating of the first reference spectrum comprises calculating the first reference spectrum, using a conversion formula defining a relation of a spectrum depending on reflectance.

15. An apparatus for analyzing a sample, the apparatus comprising:

a parameter adjuster configured to adjust a parameter of a spectroscope so that an intensity of a reflection spectrum of a sample to be analyzed by the spectroscope has a value in a range;

a sample spectrum measurer configured to measure the reflection spectrum of the sample, using the spectroscope having the adjusted parameter;

a reference material spectrum measurer configured to;

adjust reflectance of a reference material so that an intensity of a reflection spectrum of the reference material is not saturated; and

measure the reflection spectrum of the reference material, using the spectroscope having the adjusted parameter;

a first reference spectrum calculator configured to, in response to the adjusted reflectance of the reference material not being one hundred percent, calculate a first reference spectrum based on the measured reflection spectrum of the reference material;

a second reference spectrum measurer configured to measure a second reference spectrum of the reference material, using the spectroscope having the adjusted parameter, in response to a light source of the spectroscope being turned off; and

a calculator configured to calculate any one or any combination of transmittance, reflectance, or absorbance based on the reflection spectrum of the sample, the first reference spectrum, and the second reference spectrum.

16. The apparatus of claim 15, wherein the range is determined to maximize a performance of the spectroscope.

17. The apparatus of claim 15, wherein the parameter of the spectroscope comprises at least one of a preamp coefficient of the light source, an integration time of the light source, a scan number of the light source, and a resolution of the light source.

18. The apparatus of claim 15, wherein the reference material comprises a first plate where a fully reflective material is applied, and a second plate where a light-absorbing material is applied as a pattern, the first plate overlapping the second plate to slide together, and

the reference material spectrum measurer is further configured to adjust the reflectance of the reference material through the first plate and the second plate sliding together.

19. The apparatus of claim 15 wherein the reference material comprises a fully reflective material, and a film disposed on the fully reflective material and configured to adjust a transparency of the fully reflective material, and

the reference material spectrum measurer is further configured to adjust the reflectance of the reference material by adjusting the transparency of the film.

20. The apparatus of claim 15, wherein the reference material spectrum measurer is further configured to adjust the reflectance of the reference material by reducing a number of light sources of the spectroscope to be used in the measurement of the reflection spectrum of the reference material, or readjusting the adjusted parameter of the spectroscope.