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Test apparatus for generating reference scan chain test data and test system

  • US 9,885,752 B2
  • Filed: 08/12/2010
  • Issued: 02/06/2018
  • Est. Priority Date: 08/12/2010
  • Status: Active Grant
First Claim
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1. A test system comprising:

  • a test pattern generator configured to;

    receive an input scan chain;

    generate a modified input scan chain by replacing a first predefined number of start bits of the input scan chain with a predefined start bit sequence; and

    provide the modified input scan chain to a device under test (DUT); and

    an output data modifier and configured to;

    receive an output scan chain that is generated by the DUT in response to the modified input scan chain;

    generate a modified output scan chain by replacing a second predefined number of end bits of the output scan chain with a predefined end bit sequence; and

    obtain first reference scan chain test data based on the modified output scan chain.

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