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Method and apparatus with program suspend using test mode

  • US 9,892,794 B2
  • Filed: 01/02/2017
  • Issued: 02/13/2018
  • Est. Priority Date: 01/04/2016
  • Status: Active Grant
First Claim
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1. A method comprising:

  • initiating operation of a nonvolatile memory device that is not capable of performing a program suspend command;

    sending a first program instruction and a first set of trim values from a nonvolatile memory controller to the nonvolatile memory device while the nonvolatile memory device is in a test mode such that the first program instruction and the first set of trim values are stored in trim registers of the nonvolatile memory device;

    exiting the test mode, the nonvolatile memory device operable upon exiting the test mode to perform a first program slice by executing the first program instruction using the first set of trim values so as to apply a first predetermined number of program pulses to memory cells of a NAND memory array of the nonvolatile memory device;

    after performing the first program slice, sending a second program instruction and a second set of trim values from the nonvolatile memory controller to the nonvolatile memory device while the nonvolatile memory device is in the test mode such that the second program instruction and the second set of trim values are stored in the trim registers;

    exiting the test mode, the nonvolatile memory device operable upon exiting the test mode to perform a second program slice by executing the second program instruction using the second set of trim values so as to apply a second predetermined number of program pulses to the memory cells of the NAND memory array; and

    if one or more read command is pending at the nonvolatile memory controller when the first program slice is completed, performing the one or more pending read command prior to performing the second program slice.

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