Systems, methods, and software for determining spatially variable distributions of the dielectric properties of a material

• US 9,909,987 B1
• Filed: 07/30/2015
• Issued: 03/06/2018
• Est. Priority Date: 07/30/2014
• Status: Active Grant

• Current Assignee: Transcend Engineering and Technology, LLC
• Original Assignee: Transcend Engineering and Technology, LLC
• Inventors: Farrington, Stephen P.
• Primary Examiner(s): Nguyen, Vinh
• Application Number:
  US14/813,834
• Time in Patent Office: 950 Days
• CPC Class Codes: G01D 5/353 influencing the transmission properties of an optical fibre
• CPC Class Codes: G01N 27/02 by investigating impedance
• CPC Class Codes: G01N 33/246 for water content for control of watering A01G25/167

Abstract

Systems, methods, and software for measuring the spatially variable relative dielectric permittivity of materials along a linear or otherwise configured sensor element, and more specifically the spatial variability of soil moisture in one dimension as inferred from the dielectric profile of the soil matrix surrounding a linear sensor element. Various methods described herein combine advances in the processing of time domain reflectometry data with innovations in physical sensing apparatuses. These advancements enable high temporal (and thus spatial) resolution of electrical reflectance continuously along an insulated waveguide that is permanently emplaced in contact with adjacent soils. The spatially resolved reflectance is directly related to impedance changes along the waveguide that are dominated by electrical permittivity contrast due to variations in soil moisture. Various methods described herein are thus able to monitor soil moisture in profile with high spatial resolution.

Claims

1. A method of determining spatially variable distributions of one or more electrical properties of a material, comprising:

disposing an insulated parallel waveguide adjacent the material, the insulated parallel waveguide operably connected to measurement instrumentation;

performing a time domain reflectometry measurement of the insulated parallel waveguide via the measurement instrumentation to acquire a temporal profile of apparent reflectance;

converting the temporal profile of apparent reflectance to a temporal profile of a quantity indicative of the one or more electrical properties of the material;

converting the temporal profile of a quantity indicative of the one or more electrical properties of the material to a spatial profile of the quantity indicative of the one or more electrical properties of the material;

converting the spatial profile to a spatial profile of moisture content of the material; and

making the spatial profile of moisture content available to a user for analysis or other use.

2. A method according to claim 1, wherein said disposing includes disposing and burying the waveguide in a trench.

3. A method according to claim 1, wherein said disposing includes disposing the waveguide in a substantially vertically oriented cavity.

4. A method according to claim 1, wherein the making the spatial profile of moisture content available to a user for analysis or other use includes at least one of displaying the spatial profile of moisture content on a display, storing the spatial profile of moisture content on a computer readable medium, or transmitting the spatial profile of moisture content to another device.

5. A method according to claim 1, wherein the measurement instrumentation includes a time domain reflectometer, further wherein said temporal profile of apparent reflectance is a discrete time series of reflectance measurements.

6. A method according to claim 1, wherein the temporal profile of a quantity indicative of the one or more electrical properties is algebraically proportional to the dielectric of adjacent materials.

7. A method according to claim 6, wherein the temporal profile of a quantity indicative of the one or more electrical properties is a temporal profile of ƒ

(ρ

), wherein

ƒ

(ρ

)=[(1−

ρ

)/(1+ρ

)]²,

and wherein ρ

is reflectance.

8. A method according to claim 1, wherein the temporal profile of a quantity indicative of the one or more electrical properties of the material includes temporal profile of transmission line impedance.

9. A method according to claim 1, wherein the spatial profile of the quantity indicative of the one or more electrical properties of the material includes a spatial profile of material dielectric constant.

10. A non-transitory machine-readable storage medium containing machine-executable instructions for performing a method of determining spatially variable distributions of one or more electrical properties of a material, said machine-readable instructions comprising:

a first set of machine-executable instructions for performing a time domain reflectometry measurement of an insulated parallel waveguide disposed proximal to the material via measurement instrumentation to acquire a temporal profile of apparent reflectance;

a second set of machine-executable instructions for converting the temporal profile of apparent reflectance to a temporal profile of a quantity indicative of the one or more electrical properties of the material;

a third set of machine-executable instructions for converting the temporal profile of a quantity indicative of the one or more electrical properties of the material to a spatial profile of moisture content; and

a fourth set of machine-executable instructions for making the spatial profile of moisture content available to a user for analysis or other use.