Inspection systems with two X-ray scanners in a first stage inspection system

• US 9,915,752 B2
• Filed: 04/10/2015
• Issued: 03/13/2018
• Est. Priority Date: 08/08/2003
• Status: Expired due to Term

• Current Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Original Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Inventors: Peschmann, Kristian R.
• Primary Examiner(s): Yun, Jurie
• Application Number:
  US14/684,089
• Publication Number:
  US 20160025888A1
• Time in Patent Office: 1,068 Days
• Field of Search: 378 4- 6, 378 9, 378 20, 378 44- 46, 378 57, 378 70- 90
• CPC Class Codes: G01N 2223/076 X-ray fluorescence
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
• CPC Class Codes: G01N 23/20083 by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
• CPC Class Codes: G01N 23/223 by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• CPC Class Codes: G01V 5/00 Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
• CPC Class Codes: G01V 5/222 measuring scattered radiation
• CPC Class Codes: G01V 5/224 Multiple energy techniques using one type of radiation, e.g. X-rays of different energies
• CPC Class Codes: G01V 5/226 using tomography
• CPC Class Codes: G01V 5/228 using stereoscopic means
• CPC Class Codes: G01V 5/281 detecting special nuclear material [SNM], e.g. Uranium-235, Uranium-233 or Plutonium-239

Abstract

This invention is directed towards finding, locating, and confirming threat items and substances. The inspection system is designed to detect objects that are made from, but not limited to, special nuclear materials (“SNM”) and/or high atomic number materials. The system employs advanced image processing techniques to analyze images of an object under inspection (“OUI”), which includes, but is not limited to baggage, parcels, vehicles and cargo, and fluorescence detection.

Claims

1. An inspection system comprising:

a first inspection stage comprising;

a first X-ray scanner, wherein the first X-ray scanner comprises an X-ray tube having an extended spectral emission;

a second X-ray scanner wherein the first X-ray scanner and second X-ray scanner are positioned around an inspection volume, wherein the first X-ray scanner is positioned at a 7 o'"'"'clock position relative to said inspection volume, wherein the second X-ray scanner is positioned at a 5 o'"'"'clock position relative to said inspection volume, and wherein X-ray projections from the first X-ray scanner and X-ray projections from the second X-ray scanner are mirrored relative to a central vertical scanning plane in said inspection volume, a detector array positioned around the inspection volume and configured to generate image data;

wherein the detector array comprises an array of stacked detectors, wherein a first detector of said stacked detectors is positioned to detect low energy X-ray photons emitted from one of the first X-ray scanner or second X-ray scanner and wherein a second detector of said stacked detectors is positioned behind the first detector to detect higher energy photons emitted from a same one of the first X-ray scanner or second X-ray scanner;

a conveyor belt positioned with said inspection volume and configured to move an object being inspected through said inspection volume; and

a first processor coupled to said detector array and configured to receive said image data and generate an image volume file of the object being inspected.

2. The inspection system of claim 1 wherein the detector array and first processor are configured to generate image data coded in gravimetric density.

3. The inspection system of claim 2, wherein the first inspection stage further comprises

a sensor configured to determine when the object being inspected enters the inspection volume of the first inspection stage;

and

a controller configured to control an activation and deactivation of at least one of the first X-ray scanner and second X-ray scanner based on the sensor reading.

4. The inspection system of claim 1 wherein the first processor is configured to execute an automatic image analysis to determine at least one of an approximate shape, size, density, weight and location of a potential threat within the object being inspected.

5. The inspection system of claim 1 wherein said detector array generates dual energy data and wherein said first processor is configured to use said dual energy data to automatically discriminate between material having an atomic number of 13 and material having an atomic number of 26.

6. The inspection system of claim 1 wherein the detector array is configured in an L-shape around said inspection volume.