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Automated atomic force microscope and the operation thereof

  • US 9,921,242 B2
  • Filed: 07/05/2016
  • Issued: 03/20/2018
  • Est. Priority Date: 04/21/2014
  • Status: Active Grant
First Claim
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1. A cantilever based measuring instrument apparatus, comprising:

  • a cantilever based instrument that has a cantilever, where the cantilever is driven by a driving signal to measure a surface, and the instrument uses a feedback loop with a signal from the cantilever, said feedback loop having a controllable gain;

    a computer based controller, operating to measure and produce sensitivity information about the cantilever without touching the surface, where said sensitivity information is a function of said gain in the feedback loop; and

    said controller accepting a setting of desired gain, and based on said setting of desired gain, estimating parameters to drive the cantilever based instrument to measure said surface using said sensitivity information and said amount of desired gain, by using a tip of the cantilever to measure characteristics of the surface.

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