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Detection of contamination at sensor contacts

  • US 9,936,903 B2
  • Filed: 04/13/2012
  • Issued: 04/10/2018
  • Est. Priority Date: 04/14/2011
  • Status: Active Grant
First Claim
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1. An electronics assembly comprising:

  • a hermetic housing;

    a sensor contact disposed on an exterior surface of the housing, and configured to receive a sensor signal from a sensor assembly when the sensor assembly is coupled to the electronics assembly, the sensor signal being representative of a level of an analyte in a body;

    a processor coupled to the sensor contact and configured to receive the sensor signal;

    an open detection contact disposed on the exterior surface of the housing that is not couplable to any contact on the sensor assembly and is configured to detect a leakage current between the sensor contact and the open detection contact due to contamination at or near the sensor contact; and

    a switch coupled to the detection contact, controlled by the processor, and configured to couple the detection contact to a bias voltage during a measurement mode and to couple the detection contact to a reference voltage during a detection mode, the reference voltage being different from the bias voltage,wherein the processor is configured to periodically switch from the measurement mode to the detection mode and measure a first value of the sensor signal during the measurement mode and a second value of the sensor signal during the detection mode to detect a leakage current of the sensor signal, wherein if the difference between the first value and the second value is greater than a threshold amount, the processor identifies that there is a leakage current present.

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