Method and data storage device with enhanced data retention
First Claim
Patent Images
1. A method comprising:
- a data storage device including a controller and a non-volatile memory,wherein the non-volatile memory includes a data structure that stores data, performing by the controller;
detecting a triggering event that indicates an extended period of inactivity of the data storage device by testing at least one storage element for a change in a programmed voltage occurring over a time of programming to a time of the testing exceeds a change threshold; and
responsive to detecting the triggering event, initiating a data retention operation, wherein the data retention operation includes;
adjusting a write parameter of the non-volatile memory from a first value to a second value; and
storing at least one copy of the data in the non-volatile memory using the second value of the write parameter,wherein the write parameter includes at least one of a voltage level that indicates a program state of a storage element, a number of program pulses used to set a program state of the storage element, or a program voltage level of each program pulse.
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Abstract
A data retention operation is performed in a non-volatile memory in response to detection of a triggering event. The data retention operation includes updating a value of a write parameter of the non-volatile memory and storing into the non-volatile memory at least one copy of contents of a boot portion of the non-volatile memory using the updated value of the write parameter. The updated value of the write parameter increases retention of stored data during extended periods of inactivity at the non-volatile memory.
6 Citations
26 Claims
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1. A method comprising:
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a data storage device including a controller and a non-volatile memory, wherein the non-volatile memory includes a data structure that stores data, performing by the controller; detecting a triggering event that indicates an extended period of inactivity of the data storage device by testing at least one storage element for a change in a programmed voltage occurring over a time of programming to a time of the testing exceeds a change threshold; and responsive to detecting the triggering event, initiating a data retention operation, wherein the data retention operation includes; adjusting a write parameter of the non-volatile memory from a first value to a second value; and storing at least one copy of the data in the non-volatile memory using the second value of the write parameter, wherein the write parameter includes at least one of a voltage level that indicates a program state of a storage element, a number of program pulses used to set a program state of the storage element, or a program voltage level of each program pulse. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A data storage device comprising:
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a non-volatile memory having a data structure that is configured to store data of at least one of a controller or an access device; and the controller operatively coupled to the non-volatile memory, wherein the controller includes a data retention module that is configured to detect a triggering event and initiate a data retention operation in response to detecting the trigger event that indicates an extended period of inactivity of the data storage device by testing at least one storage element for a change in a programmed voltage occurring over a time of programming to a time of the testing exceeds a change threshold, wherein the data retention operation includes updating a write parameter of the non-volatile memory from a first value to a second value and initiating storage of at least one copy of the data in the non-volatile memory using the second value of the write parameter, wherein the write parameter includes at least one of a voltage level that indicates a program state of the at least one storage element, a number of program pulses used to set the program state of the at least one storage element, or a program voltage level of each program pulse. - View Dependent Claims (12, 13, 14, 15)
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16. A method comprising:
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in a data storage device including a controller and a non-volatile memory, performing; receiving an instruction from an access device that indicates an extended period of inactivity of the data storage device based on testing at least one storage element for a change in a programmed voltage occurring over a time of programming to a time of the testing exceeds a change threshold; initiating a data retention procedure of the non-volatile memory in response to receiving the instruction; and updating a status register value to indicate completion of the data retention procedure, wherein the data retention procedure includes; adjusting a write parameter of the non-volatile memory from a first value to a second value; and storing, using the second value of the write parameter, at least one copy of data read from a data structure in the non-volatile memory, wherein the write parameter includes at least one of a voltage level that indicates a program state of the at least one storage element, a number of program pulses used to set the program state of the at least one storage element, or a program voltage level of each program pulse. - View Dependent Claims (17)
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18. A method comprising:
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in an access device that is coupled to a data storage device, performing; detecting an event corresponding to a period of inactivity at the access device by testing at least one storage element for a change in a programmed voltage occurring over a time of programming to a time of the testing exceeds a change threshold; and in response to detecting the event, sending an instruction from the access device to the data storage device indicating that a data retention procedure is to be initiated at the data storage device, wherein the data retention procedure includes; adjusting a write parameter of a non-volatile memory of the data storage device from a first value to a second value; and storing at least one copy of data in the non-volatile memory using the second value of the write parameter, wherein the write parameter includes at least one of a voltage level that indicates a program state of a the at least one storage element, a number of program pulses used to set the program state of the at least one storage element, or a program voltage level of each program pulse. - View Dependent Claims (19, 20, 21, 22, 23)
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24. An access device comprising:
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a memory interface; and a controller including a hibernation circuit, the hibernation circuit configured to detect an event corresponding to a period of inactivity at the access device by testing at least one storage element for a change in a programmed voltage occurring over a time of programming to a time of testing that exceeds a change threshold, and to send an instruction, via the memory interface, to a data storage device in response to detecting the event, wherein the instruction indicates that a data retention procedure is to be initiated at the data storage device, wherein the data retention procedure includes; adjusting a write parameter of a non-volatile memory of the data storage device from a first value to a second value; and storing at least one copy of data in the non-volatile memory using the second value of the write parameter, wherein the write parameter includes at least one of a voltage level that indicates a program state of the at least one storage element, a number of program pulses used to set the program state of the at least one storage element, or a program voltage level of each program pulse. - View Dependent Claims (25, 26)
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Specification