Sensor array

• US 9,945,804 B2
• Filed: 07/17/2015
• Issued: 04/17/2018
• Est. Priority Date: 07/17/2014
• Status: Active Grant

• Current Assignee: Siemens Healthcare Diagnostics Incorporated (Siemens AG)
• Original Assignee: Siemens Healthcare Diagnostics Incorporated (Siemens AG)
• Inventors: Samproni, Jennifer A.
• Primary Examiner(s): NOGUEROLA, ALEXANDER STEPHAN
• Application Number:
  US15/325,307
• Publication Number:
  US 20170184532A1
• Time in Patent Office: 1,005 Days
• CPC Class Codes: G01N 27/27 Association of two or more measuring systems or cells, each measuring a different parameter, where the measurement results may be either used independently, the systems or cells being physically associated, or combined to produce a value for a further parameter
• CPC Class Codes: G01N 27/3272 Test elements therefor, i.e. disposable laminated substrates with electrodes, reagent and channels optical biosensors G01N33/52

Abstract

In one illustrative embodiment, a test strip with a first planar substrate has coplanar electrodes on a first planar surface and a second planar substrate (which opposes the first surface of the first planar substrate) has coplanar electrodes on a second planar surface. The first planar surface of the first planar substrate having a first sensing area electrically connected to a first electrical contact. The second planar surface of the second planar substrate having a second electrical contact electrically connected to the first electrical contact via a conductive element, the conductive element extending between the first surface of the first planar substrate and the second surface of the second planar substrate without passing through the first planar substrate, the second planar substrate, or any intermediate layers.

Claims

1. A test strip comprising:

a first planar substrate with coplanar electrodes on a first planar surface and a second planar substrate with coplanar electrodes on a second planar surface, the first planar substrate and the second planar substrate being arranged such that the first surface of the first planar substrate opposes the second planar surface of the second planar substrate;

an intermediate layer disposed in between the opposed first surface of the first planar substrate and the second planar surface of the second planar substrate;

the first planar surface of the first planar substrate having a first sensing area electrically connected to a first electrical contact; and

the second planar surface of the second planar substrate having a second electrical contact electrically connected to the first electrical contact via a conductive element, the conductive element extending between the first surface of the first planar substrate and the second surface of the second planar substrate without passing through the first planar substrate or the second planar substrate.

2. The test strip of claim 1, wherein the second electrical contact is electrically connected to the conductive element without passing through the intermediate layer.

3. The test strip of claim 1, wherein the second planar surface of the second planar substrate further comprises a second sensing area electrically connected to a third electrical contact;

and

wherein the second electrical contact on the second planar substrate is not electrically connected to a sensing area on the second surface of the second planar substrate.

4. The test strip of claim 1, wherein the area of the first surface of the first planar substrate is smaller than the second planar surface of the second planar substrate thereby leaving a portion of the area of the second surface of the second substrate uncovered by the first surface of the first planar substrate;

and

wherein a portion of the second electrical contact is located in the uncovered portion of the second surface of the second planar substrate.

5. The test strip of claim 1, wherein the conductive element extends in a direction that is substantially perpendicular to the first planar surface and the second planar surface.

6. The test strip of claim 1, wherein the conductive element is a pogo pin, a wire, or a deposit of conductive metal.

7. A test strip comprising:

a first planar substrate having a first planar surface and a second planar surface;

a first conductive layer formed on the second planar surface of the first planar substrate, the first conductive layer forming a first electrical contact;

a second planar substrate having a first planar surface and a second planar surface, the second planar substrate being disposed below the first planar substrate along a line extending from the first planar surface of the first planar substrate to the second surface of the first planar substrate, the first planar surface of the second planar substrate facing the second surface of the first planar substrate, the first and second planar surfaces of the second planar substrate having a larger surface area than the area of both the first and second planar surfaces of the first planar substrate;

a second conductive layer formed on the first planar surface of the second planar substrate, the second conductive layer comprising a second electrical contact;

a first planar intermediate layer disposed in between the second surface of the first planar substrate and the first surface of second planar substrate, the first planar intermediate layer defining a fluid flow path configured so that when a liquid is flowing through the fluid flow path the liquid is in fluidic contact with at least part of the first electrical contact and at least part of the second electrical contact, the first and second planar surfaces of the first planar intermediate layer having a smaller surface area than the area of the first and the area of the second planar surfaces of the first planar substrate as well as the area of the first and the area of the second planar surfaces of the second planar substrate;

wherein when viewing the sensor assembly from above the first surface of the first planar substrate along the line, a portion of the second planar substrate and the second electrical contact are uncovered by another layer of the assembly; and

a conductive element electrically connects the first electrical contact to the second electrical contact without passing through the first planar substrate or the second planar substrate.