Surface-enhanced raman scattering unit and raman spectroscopic analysis method

• US 9,952,158 B2
• Filed: 02/07/2014
• Issued: 04/24/2018
• Est. Priority Date: 03/29/2013
• Status: Active Grant

• Current Assignee: Hamamatsu Photonics KK
• Original Assignee: Hamamatsu Photonics KK
• Inventors: Ito, Masashi, Shibayama, Katsumi, Ofuji, Kazuto, Oyama, Hiroki, Maruyama, Yoshihiro
• Primary Examiner(s): STAFIRA, MICHAEL PATRICK
• Application Number:
  US14/780,728
• Publication Number:
  US 20160061736A1
• Time in Patent Office: 1,537 Days
• CPC Class Codes: G01N 21/658 enhancement Raman, e.g. surface plasmons

Abstract

A SERS unit 1A comprises a SERS element 2 having a substrate and an optical function part 20 formed on the substrate, the optical function part 20 for generating surface-enhanced Raman scattering; a measurement board 3 supporting the SERS element 2 upon measurement; and a holding part 4 mechanically holding the SERS element 2 in the measurement board 3.

Claims

1. A surface-enhanced Raman scattering unit comprising:

a surface-enhanced Raman scattering element having a substrate and an optical function part formed on the substrate, the optical function part for generating surface-enhanced Raman scattering;

a measurement board supporting the surface-enhanced Raman scattering element upon measurement; and

a holding part mechanically holding the surface-enhanced Raman scattering element in the measurement board,

wherein the holding part has a pinching part pinching the surface-enhanced Raman scattering element in cooperation with the measurement board, and

wherein the pinching part is formed into a ring so as to surround the optical function part when seen in a thickness direction of the substrate.

2. A surface-enhanced Raman scattering unit according to claim 1, wherein the measurement board is provided with a depression containing at least a part of the surface-enhanced Raman scattering element on the substrate side and restraining the surface-enhanced Raman scattering element from moving in a direction perpendicular to a thickness direction of the substrate.

3. A surface-enhanced Raman scattering unit according to claim 1, wherein the holding part is formed separately from the measurement board and mechanically secured to the measurement board.

4. A surface-enhanced Raman scattering unit according to claim 1, wherein the holding part is formed integrally with the measurement board.

5. A surface-enhanced Raman scattering unit according to claim 1, wherein the measurement board is formed integrally from a resin.

6. A surface-enhanced Raman scattering unit according to claim 5, wherein the measurement board is provided with a hollowed part so as to form a wall part extending in a direction perpendicular to a thickness direction of the measurement board.

7. A surface-enhanced Raman scattering unit according to claim 1, wherein the holding part pinches a side face of the surface-enhanced Raman scattering element.

8. A Raman spectroscopic analysis method comprising:

a first step of preparing the surface-enhanced Raman scattering unit according to claim 1 and arranging a sample on the optical function part; and

a second step, after the first step, of setting the surface-enhanced Raman scattering unit to a Raman spectroscopic analyzer, irradiating the sample arranged on the optical function part with excitation light, and detecting Raman-scattered light derived from the sample, so as to perform Raman spectroscopic analysis.