Testing of display subsystems

• US 9,955,150 B2
• Filed: 09/24/2015
• Issued: 04/24/2018
• Est. Priority Date: 09/24/2015
• Status: Active Grant

• Current Assignee: Qualcomm, Inc.
• Original Assignee: Qualcomm, Inc.
• Inventors: Gulati, Rahul, Wong, John Chi Kit, Bhuyan, Pranjal, Gupta, Sanjay, Shah, Hemang Jayant
• Primary Examiner(s): YENKE, BRIAN P
• Application Number:
  US14/864,348
• Publication Number:
  US 20170094268A1
• Time in Patent Office: 943 Days
• CPC Class Codes: B60K 35/00 Instruments specially adapted for vehicles; Arrangement of instruments in or on vehicles
• CPC Class Codes: G09G 2358/00 Arrangements for display data security
• CPC Class Codes: G09G 2380/10 Automotive applications
• CPC Class Codes: G09G 3/006 Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309
• CPC Class Codes: G09G 5/39 Control of the bit-mapped memory
• CPC Class Codes: H04N 17/004 for digital television systems

Abstract

A display processor of a display system may receive an image that includes a test pattern. An input checksum may be associated with the test pattern. Hardware units of the display processor may process the image. The display system may generate an output checksum based at least in part on the test pattern after processing of the image. The display system may detect a fault in the hardware units of the display processor based on determining a difference between the input checksum and the output checksum.

Claims

1. A method for testing of a display system, the method comprising:

performing, by a computing device, a built-in self test of a display processor of the computing device without entering a dedicated test mode, including;

receiving, by the computing device from a video source, an image that is to be processed by the display processor, wherein the image includes a visual region and a non-visual region,

modifying, by the computing device, the image that is to be processed by the display processor to include a test pattern associated with an input checksum in the non-visual region of the image,

processing, by one or more pre-determined hardware units of the display processor, the image, including performing, by the one or more pre-determined hardware units of the display processor, one or more image processing operations on the image that alter at least a portion of the visual region of the image,

generating, by the display processor, an output checksum based at least in part on the test pattern after processing of the image by the one or more pre-determined hardware units of the display processor, and

prior to outputting the image to a display device, detecting, by the computing device, whether a fault has occurred in the one or more pre-determined hardware units of the display processor based at least in part on determining whether there is a difference between the input checksum and the output checksum; and

in response to determining that the fault has not occurred in the one or more pre-determined hardware units of the display processor, outputting, by the display processor, the image to the display device, so that the display device displays the visual region of the image without displaying the non-visual region of the image that includes the test pattern.

2. The method of claim 1, further comprising:

capturing, by the video source, a video; and

modifying, by the computing device, a frame of the video to include the test pattern.

3. The method of claim 1, wherein processing, by the one or more pre-determined hardware units of the display processor, the image, comprises processing, by a display subsystem pipeline of the display processor, the image.

4. The method of claim 1, further comprising:

generating, by the computing device, a test pattern image, wherein an input test checksum is associated with the test pattern image;

during a vertical blanking interval for the display processor of the computing device, processing, by the one or more pre-determined hardware units of the display processor, the test pattern image;

generating, by the display processor, an output test checksum based at least in part on the test pattern image after processing of the test pattern image by the one or more pre-determined hardware units of the display processor; and

detecting, by the computing device, a fault in the one or more pre-determined hardware units of the display processor based at least in part on determining a difference between the input test checksum and the output test checksum.

5. The method of claim 4, further comprising:

performing, by the display processor, the processing and the detecting for every n-th vertical blanking interval of a plurality of vertical blanking intervals for the display processor, wherein n is greater than one.

6. The method of claim 4, further comprising:

performing, by the display processor, the processing and the detecting for every vertical blanking interval of a plurality of vertical blanking intervals for the display processor.

7. An apparatus comprising:

a memory configured to store an image received from an image source, wherein the image includes a visual region and a non-visual region;

a display processor configured to perform a built-in self test of the display processor without entering a dedicated test mode, including;

modify the image that is to be processed by the display processor to include a test pattern associated with an input checksum in the non-visual region of the image;

process, by one or more pre-determined hardware units of the display processor, the image, including performing, by the one or more pre-determined hardware units of the display processor, one or more image processing operations on the image that alter at least a portion of the visual region of the image;

generate an output checksum based at least in part on the test pattern after processing of the image by the one or more pre-determined hardware units of the display processor;

prior to outputting the image to a display device, detect whether a fault has occurred in the one or more pre-determined hardware units of the display processor based at least in part on determining whether there is a difference between the input checksum and the output checksum; and

in response to determining that the fault has not occurred in the one or more pre-determined hardware units of the display processor, output the image to the display device, so that the display device displays the visual region of the image without displaying the non-visual region of the image that includes the test pattern.

8. The apparatus of claim 7, wherein:

the video source is configured to output a video to the memory; and

the display processor is further configured to;

modify a frame of the video to include the test pattern.

9. The apparatus of claim 8, wherein:

the apparatus is a vehicle that includes an advanced driver assistance system (ADAS); and

the ADAS includes the memory and the display processor.

10. The apparatus of claim 7, wherein the display processor is further configured to:

process, by a display subsystem pipeline of the display processor, the image.

11. The apparatus of claim 7, wherein the display processor is further configured to:

generate a test pattern image, wherein the test pattern image is associated with an input test checksum;

during a vertical blanking interval for the display processor, process the test pattern image;

generate an output test checksum based at least in part on the test pattern image after processing of the test pattern image; and

detect a fault in the one or more pre-determined hardware units of the display processor based at least in part on determining a difference between the input test checksum and the output test checksum.

12. The apparatus of claim 11, wherein the display processor is further configured to:

perform the processing and the detecting for every n-th vertical blanking interval of a plurality of vertical blanking intervals for the display processor, wherein n is greater than one.

13. The apparatus of claim 11, wherein the display processor is further configured to:

perform the processing and the detecting for every vertical blanking interval of a plurality of vertical blanking intervals for the display processor.

14. The apparatus of claim 13, wherein:

the apparatus is an advanced driver assistance system (ADAS).

15. An apparatus comprising:

means performing a built-in self test without entering a dedicated test mode, including;

means for receiving, from a means for capturing video, an image that is to be processed, wherein the image includes a visual region and a non-visual region,

means for modifying the image to include a test pattern associated with an input checksum in the non-visual region of the image,

means for processing the image, including means for performing one or more image processing operations on the image that alter at least a portion of the visual region of the image,

means for generating an output checksum based at least in part on the test pattern after processing of the image by the means for processing the image, and

means for detecting whether a fault has occurred in the means for processing the image based at least in part on determining whether there is a difference between the input checksum and the output checksum prior to outputting the image to a display device; and

means for, in response to determining that the fault has not occurred in the means for processing the image, outputting the image to means for displaying the image, so that the means for displaying the image displays the visual region of the image without displaying the non-visual region of the image that includes the test pattern.

16. The apparatus of claim 15, further comprising:

means for modifying a frame of the video to include the test pattern.

17. The apparatus of claim 15, further comprising:

means for generating a test pattern image, wherein the test pattern image is associated with an input test checksum;

means for processing, during a vertical blanking interval for the means for processing the image, the test pattern image;

means for generating an output test checksum based at least in part on the test pattern image after processing of the test pattern image by the means for processing; and

means for detecting a fault in the means for processing the test pattern image based at least in part on determining a difference between the input test checksum and the output test checksum.

18. A non-transitory computer-readable storage medium comprising instructions for causing at least one programmable processor to:

perform a built-in self test of a display processor without entering a dedicated test mode, including;

receive, from a video source, an image that is to be processed by the display processor, wherein the image includes a visual region and a non-visual region,

modify, by the computing device, the image that is to be processed by the display processor to include a test pattern associated with an input checksum in the non-visual region of the image,

process the image, including performing, by one or more pre-determined hardware units of the display processor, one or more image processing operations on the image that alter at least a portion of the visual region of the,

generate an output checksum based at least in part on the test pattern after the processing of the image, and

prior to outputting the image to a display device, detect whether a fault has occurred in the one or more pre-determined hardware units of the display processor based at least in part on determining whether there is a difference between the input checksum and the output checksum; and

in response to determining that the fault has not occurred in the one or more pre-determined hardware units of the display processor, output the image to the display device, so that the display device displays the visual region of the image without displaying the non-visual region of the image that includes the test pattern.

19. The non-transitory computer-readable storage medium of claim 18, wherein the instructions further cause the at least one programmable processor to:

capture a video; and

modify a frame of the video to include the test pattern.

20. The non-transitory computer-readable storage medium of claim 18, wherein the instructions further cause the at least one programmable processor to:

generate a test pattern image, wherein the test pattern image is associated with an input test checksum;

during a vertical blanking interval for the display processor of the computing device, process the test pattern image;

generate an output checksum based at least in part on the test pattern image after processing of the test pattern image; and

detect a fault in the one or more pre-determined hardware units of the display processor based at least in part on determining a difference between the input test checksum and the output test checksum.

21. The non-transitory computer-readable storage medium of claim 20, wherein the instructions further cause the at least one programmable processor to:

perform the processing and the detecting for every n-th vertical blanking interval of a plurality of vertical blanking intervals for the display processor, wherein n is greater than one.