Method for testing a device under test, electronic device, and measurement unit
First Claim
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1. A test method for testing a device under test with a measurement unit, the method comprising:
- transmitting a number of test commands from the measurement unit to the device under test via a test interface of the device under test,generating in the device under test in response to the test commands respective communication signals,emitting by the device under test the generated communication signals via a wireless communication interface,receiving the communication signals from the device under test in the measurement unit, andevaluating the received communication signals in the measurement unit,wherein the test commands comprise test commands that cause the device under test to perform an instructed internal configuration, andwherein the test commands cause the device under test;
to set a carrier frequency for the generated communication signals and/or signal reception in the device under test,to set a bandwidth for the generated communication signals and/or signal reception in the device under test,to set a phase of a specific transmission channel for the generated communication signals and/or reception channel for signal reception in the device under test,to set a modulation scheme for the generated communication signals and/or signal reception in the device under test,to set a transmit power for the generated communication signals, wherein the respective test commands comprise a single power value or a sequence of power values that the device under test sets at a predetermined step frequency, andto set a attenuation factor for the signal reception in the device under test.
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Abstract
A test method for testing a device under test with a measurement unit comprises transmitting a number of test commands from the measurement unit to the device under test via a test interface of the device under test, generating in the device under test in response to the test commands respective communication signals, emitting by the device under test the generated communication signals via a wireless communication interface, receiving signals from the device under test in the measurement unit, and evaluating the received signals in the measurement unit.
23 Citations
47 Claims
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1. A test method for testing a device under test with a measurement unit, the method comprising:
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transmitting a number of test commands from the measurement unit to the device under test via a test interface of the device under test, generating in the device under test in response to the test commands respective communication signals, emitting by the device under test the generated communication signals via a wireless communication interface, receiving the communication signals from the device under test in the measurement unit, and evaluating the received communication signals in the measurement unit, wherein the test commands comprise test commands that cause the device under test to perform an instructed internal configuration, and wherein the test commands cause the device under test; to set a carrier frequency for the generated communication signals and/or signal reception in the device under test, to set a bandwidth for the generated communication signals and/or signal reception in the device under test, to set a phase of a specific transmission channel for the generated communication signals and/or reception channel for signal reception in the device under test, to set a modulation scheme for the generated communication signals and/or signal reception in the device under test, to set a transmit power for the generated communication signals, wherein the respective test commands comprise a single power value or a sequence of power values that the device under test sets at a predetermined step frequency, and to set a attenuation factor for the signal reception in the device under test. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27)
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28. An electronic device comprising:
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a test interface for receiving a number of test commands from a measurement unit and/or sending test data to the measurement unit, a test controller for generating respective communication signals in response to the test commands, a wireless communication interface for emitting the generated communication signals and/or for receiving communication signals from the measurement unit, wherein the test commands comprise test commands that cause the device under test to perform an instructed internal configuration, and wherein the test commands cause the device under test; to set a carrier frequency for the generated communication signals and/or signal reception in the device under test, to set a bandwidth for the generated communication signals and/or signal reception in the device under test, to set a phase of a specific transmission channel for the generated communication signals and/or reception channel for signal reception in the device under test, to set a modulation scheme for the generated communication signals and/or signal reception in the device under test, to set a transmit power for the generated communication signals, wherein the respective test commands comprise a single power value or a sequence of power values that the device under test sets at a predetermined step frequency, and to set a attenuation factor for the signal reception in the device under test. - View Dependent Claims (29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40)
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41. A measurement unit comprising:
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a test interface for transmitting a number of test commands to a device under test and/or receiving test data from the test device, a communication interface for receiving communication signals from the device under test and/or sending communication signals to the device under test, and a test controller for evaluating the received communication signals in the measurement unit, wherein the test commands comprise test commands that cause the device under test to perform an instructed internal configuration, and wherein the test commands cause the device under test; to set a carrier frequency for the generated communication signals and/or signal reception in the device under test, to set a bandwidth for the generated communication signals and/or signal reception in the device under test, to set a phase of a specific transmission channel for the generated communication signals and/or reception channel for signal reception in the device under test, to set a modulation scheme for the generated communication signals and/or signal reception in the device under test, to set a transmit power for the generated communication signals, wherein the respective test commands comprise a single power value or a sequence of power values that the device under test sets at a predetermined step frequency, and to set a attenuation factor for the signal reception in the device under test. - View Dependent Claims (42, 43, 44, 45, 46, 47)
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Specification