Method and device for determining a critical angle of an excitation light beam

• US 9,958,319 B2
• Filed: 04/05/2013
• Issued: 05/01/2018
• Est. Priority Date: 04/05/2012
• Status: Active Grant

• Current Assignee: Carl Zeiss Microscopy GmbH (Carl-Zeiss-Stiftung)
• Original Assignee: Carl Zeiss Microscopy GmbH (Carl-Zeiss-Stiftung)
• Inventors: Zur Nieden, Robin
• Primary Examiner(s): Philippe, Gims
• Assistant Examiner(s): Kir, Albert
• Application Number:
  US13/857,610
• Publication Number:
  US 20130265407A1
• Time in Patent Office: 1,852 Days
• Field of Search: 348 79, 348 46, 356445, 356318, 356246, 356326, 356135, 356128, 356136, 250459, 250458, 250461, 250453, 2502521, 2504612
• CPC Class Codes: G01J 1/58 using luminescence generated by light
• CPC Class Codes: G01N 21/6458 Fluorescence microscopy fluorescence microscopes per se G02B21/0076 and G02B21/16
• CPC Class Codes: G02B 21/16 adapted for ultraviolet illumination ; Fluorescence microscopes G02B21/0076 takes precedence

Abstract

A method for determining a critical angle of total reflection based upon images captured at different angles of incidence of a light beam includes illuminating a sample with an excitation light beam, capturing images of at least part of the sample at a plurality of different angles of incidence of the excitation light beam, and determining a critical angle of total reflection at an interface of the sample based upon analysis of the images. An apparatus for determining a critical angle of total reflection at an interface of a sample includes a light source arrangement to illuminate a sample with an angle of incidence, an image capturing arrangement to capture an image of the sample, and a processing arrangement to determine the critical angle of total reflection at an interface of the sample on the basis of an analysis of images captured at a plurality of different angles of incidence.

Claims

1. A method for determining a critical angle of total reflection, comprising:

illuminating a sample with an excitation light beam of a light source;

using an image capturing sensor, capturing fluorescence images at a plurality of different angles of incidence of the excitation light beam, wherein each of the fluorescence images comprises a first image area including an object to be examined and a second image area outside the object; and

using a processor, determining a critical angle of total reflection at an interface of the sample based upon an analysis of the fluorescence images, wherein said analysis comprises;

forming for each fluorescence image an intensity ratio between a first fluorescence intensity in the first image area of one of the fluorescence images and a second fluorescence intensity in the second image area of said one of the fluorescence images, wherein said ratio being formed by dividing one of the first and second fluorescence intensities by the other of the first and second fluorescence intensities; and

evaluating the intensity ratios for the plurality of angles of incidence.

2. The method according to claim 1, wherein the step of determining the critical angle comprises evaluating ratios of a light intensity in a predetermined area of images with adjacent angles of incidence, each ratio being formed by dividing an intensity at one angle of incidence by an intensity at an adjacent angle of incidence.

3. The method according to claim 1, wherein the step of capturing the images comprises capturing images for at least two different image planes.

4. The method according to claim 3, wherein a distance between the at least two image planes is greater than a penetration depth of an evanescent field when the angle of incidence exceeds the critical angle.

5. The method according to claim 3, wherein the step of determining the critical angle comprises a comparing of areas in images with the same angle of incidence in different image planes.

6. The method according to claim 1, wherein the step of determining the critical angle comprises comparing an intensity ratio based upon the plurality of images with a threshold value.

7. The method according to claim 1, wherein the plurality of angles of incidence is set automatically.

17. The method according to claim 1, wherein evaluating intensity ratios comprises detecting a change of the ratio at or near the critical angle based on the first intensity behaving differently from the second intensity when crossing the critical angle.

8. An apparatus for determining a critical angle of total reflection at an interface of a sample, comprising:

a light source operable to illuminate a sample with an angle of incidence;

an image capturing sensor operable to capture fluorescence images of the sample, wherein each of the fluorescence images comprises a first image area including an object to be examined and a second image area outside the object; and

a processor operable to determine a critical angle of total reflection at an interface of the sample based upon an analysis of the fluorescence images captured at a plurality of different angles of incidence, wherein said analysis comprises;

forming for each fluorescence image an intensity ratio between a first fluorescence intensity in the first image area of one of the fluorescence images and a second fluorescence intensity in the second image area of said one of the fluorescence images, wherein said ratio being formed by dividing one of the first and second fluorescence intensities by the other of the first and second fluorescence intensities; and

evaluating the intensity ratios for the plurality of angles of incidence.

9. The apparatus according to claim 8, wherein the image capturing sensor comprises one of a CCD-sensor and a CMOS-sensor.

10. The apparatus according to claim 8, wherein the processor is configured to determine the critical angle based upon contrast information of the images.

11. The apparatus according to claim 8, further comprising a device configured to change the angle of incidence.

12. The apparatus according to claim 8, further comprising an imaging device operable to change an image plane of the image capturing sensor.

13. The apparatus according to claim 12, wherein the processor is configured to determine the critical angle based upon an analysis of images captured at different image planes.

19. The apparatus according to claim 8, wherein the evaluation of light intensity ratios comprises:

for each fluorescence image;

detecting in the first image area the first fluorescence intensity;

detecting in the second image area the second fluorescence intensity; and

forming a respective intensity ratio between the first fluorescence intensity and the second fluorescence intensity; and

evaluating the respective intensity ratios for the plurality of angles of incidence.

20. The apparatus according to claim 19, wherein each respective intensity ratio is formed by dividing one of the first and second fluorescence intensities by the other of the first and second fluorescence intensities.

21. The apparatus according to claim 8, wherein the first image area is spaced apart from the second image area.

14. A method for determining a critical angle of total reflection, comprising:

illuminating a sample with an excitation light beam of a light source;

using an image capturing sensor, capturing fluorescence images of at least part of the sample at a plurality of different angles of incidence of the excitation light beam and for at least a first image plane and a second image plane different from the first image plane, wherein each image plane comprises a first image area including an object to be examined and a second image area outside the object; and

using a processor, determining a critical angle of total reflection at an interface of the sample based upon an analysis of the fluorescence images, wherein said analysis comprises;

forming for each image plane an intensity ratio between a first fluorescence intensity in the first image area of one of the image planes and a second fluorescence intensity in the second image area of said one of the image planes, wherein said ratio being formed by dividing one of the first and second fluorescence intensities by the other of the first and second fluorescence intensities; and

evaluating the intensity ratios for the plurality of angles of incidence.

15. The method according to claim 14, wherein a distance between the first and second image planes is greater than a penetration depth of an evanescent field when the angle of incidence exceeds the critical angle.

16. The method according to claim 14, wherein the step of determining the critical angle comprises a comparing of areas in images with the same angle of incidence in different image planes.

18. The method according to claim 14, wherein the step of determining the critical angle is based on one of the first and second fluorescence intensities increasing or staying constant while the other one of the first and second fluorescence intensities is decreasing when increasing the angle of incidence across the critical angle and detecting an increase of the intensity ratio when crossing the critical angle.

22. The method according to claim 14, wherein the step of capturing fluorescence images comprises:

capturing a first fluorescence image in which a focus of the image capturing sensor is in the first image plane; and

capturing a second fluorescence image in which the focus of the image capturing sensor is in the second image plane.