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Method for film formation, and pattern-forming method

  • US 9,958,781 B2
  • Filed: 04/21/2016
  • Issued: 05/01/2018
  • Est. Priority Date: 04/24/2015
  • Status: Active Grant
First Claim
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1. A pattern-forming method comprising:

  • applying a composition on an upper face side of a substrate to form a coating film on the upper face side of the substrate;

    heating the coating film in an atmosphere in which an oxygen concentration is less than 1% by volume and a temperature is higher than 450°

    C. and 800°

    C. or lower, to form a resist underlayer film on the upper face side of the substrate,forming a resist pattern on an upper face side of the resist underlayer film; and

    forming a pattern by a plurality of times of etching operations using the resist pattern as a mask such that the substrate has a pattern,wherein the composition comprises an aromatic ring-containing compound having a molecular weight of no less than 600 and no greater than 3,000,the aromatic ring-containing compound comprises a partial structure represented by formula (5), a partial structure represented by formula (6), or both thereof;

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