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System and method for providing active refraction feedback for devices with variable index of refraction

  • US 9,971,174 B2
  • Filed: 02/18/2015
  • Issued: 05/15/2018
  • Est. Priority Date: 02/18/2015
  • Status: Active Grant
First Claim
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1. A system, comprising:

  • a reference beam generator configured to generate a reference beam and to apply the reference beam to a variable-index-of-refraction (VIR) device, wherein the VIR device is configured to receive an input beam and output a steered beam, the input beam generated by a source that is different from the reference beam generator, the VIR device further configured to generate and output an altered reference beam that is different from the output steered beam, the altered reference beam based on the reference beam and based on an index of refraction for the VIR device;

    an altered reference beam sensor configured to detect the altered reference beam and to sense a characteristic of the altered reference beam corresponding to the index of refraction; and

    a voltage adjuster configured to (i) determine the index of refraction based on the characteristic of the altered reference beam, and (ii) generate a voltage adjustment based on the index of refraction.

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