System and method for providing active refraction feedback for devices with variable index of refraction
First Claim
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1. A system, comprising:
- a reference beam generator configured to generate a reference beam and to apply the reference beam to a variable-index-of-refraction (VIR) device, wherein the VIR device is configured to receive an input beam and output a steered beam, the input beam generated by a source that is different from the reference beam generator, the VIR device further configured to generate and output an altered reference beam that is different from the output steered beam, the altered reference beam based on the reference beam and based on an index of refraction for the VIR device;
an altered reference beam sensor configured to detect the altered reference beam and to sense a characteristic of the altered reference beam corresponding to the index of refraction; and
a voltage adjuster configured to (i) determine the index of refraction based on the characteristic of the altered reference beam, and (ii) generate a voltage adjustment based on the index of refraction.
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Abstract
A system for providing active refraction feedback for devices with a variable index of refraction includes a reference beam generator and an altered reference beam sensor. The reference beam generator is configured to generate a reference beam and to apply the reference beam to a variable-index-of-refraction (VIR) device. The VIR device is configured to generate an altered reference beam based on the reference beam and based on an index of refraction for the VIR device. The altered reference beam sensor is configured to detect the altered reference beam and to sense a characteristic of the altered reference beam corresponding to the index of refraction.
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Citations
20 Claims
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1. A system, comprising:
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a reference beam generator configured to generate a reference beam and to apply the reference beam to a variable-index-of-refraction (VIR) device, wherein the VIR device is configured to receive an input beam and output a steered beam, the input beam generated by a source that is different from the reference beam generator, the VIR device further configured to generate and output an altered reference beam that is different from the output steered beam, the altered reference beam based on the reference beam and based on an index of refraction for the VIR device; an altered reference beam sensor configured to detect the altered reference beam and to sense a characteristic of the altered reference beam corresponding to the index of refraction; and a voltage adjuster configured to (i) determine the index of refraction based on the characteristic of the altered reference beam, and (ii) generate a voltage adjustment based on the index of refraction. - View Dependent Claims (2, 3, 4)
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5. A system, comprising:
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a reference beam generator configured to generate a reference beam and to apply the reference beam to a variable-index-of-refraction (VIR) device, wherein the VIR device is configured to generate and output an altered reference beam based on the reference beam, the VIR device further configured to receive and steer an input beam of light to generate and output a steered beam at a steered angle, the output steered beam different from the output altered reference beam, the input beam generated by a source that is different from the reference beam generator; an altered reference beam sensor configured to detect the altered reference beam and to sense a characteristic of the altered reference beam related to an actual index of refraction corresponding to the steered angle; and a voltage adjuster configured to (i) determine the actual index of refraction based on the sensed characteristic, and (ii) generate a voltage adjustment based on the actual index of refraction. - View Dependent Claims (6, 7, 8, 9, 10, 11, 12)
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13. A method, comprising:
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applying a reference beam to a variable-index-of-refraction (VIR) device, wherein the VIR device is configured to receive an input beam and output a steered beam, the input beam generated by a source that is different from a source that generates the reference beam, the VIR device further configured to generate and output an altered reference beam that is different from the output steered beam, the altered reference beam based on the reference beam and based on an actual index of refraction for the VIR device; detecting the altered reference beam; sensing a characteristic of the altered reference beam corresponding to the actual index of refraction; determining the actual index of refraction based on the sensed characteristic; and generating a voltage adjustment based on the actual index of refraction. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
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Specification