Parallel optical examinations of a sample

• US 9,983,128 B2
• Filed: 10/29/2012
• Issued: 05/29/2018
• Est. Priority Date: 11/03/2011
• Status: Active Grant

• Current Assignee: Siemens Healthcare Nederland B.V. (Siemens AG)
• Original Assignee: Koninklijke Philips N.V.
• Inventors: Neijzen, Jacobus Hermanus Maria, Dittmer, Wendy Uyen
• Primary Examiner(s): Siefke, Samuel P
• Application Number:
  US14/355,462
• Publication Number:
  US 20140286826A1
• Time in Patent Office: 2,038 Days
• Field of Search: None
• CPC Class Codes: B01L 2300/0654 Lenses; Optical fibres
• CPC Class Codes: B01L 2300/0816 Cards, e.g. flat sample carriers usually with flow in two horizontal directions
• CPC Class Codes: B01L 2300/0864 comprising only one inlet and multiple receiving wells, e.g. for separation, splitting
• CPC Class Codes: B01L 2300/168 Specific optical properties, e.g. reflective coatings
• CPC Class Codes: B01L 2400/0688 surface tension valves, capillary stop, capillary break
• CPC Class Codes: B01L 3/502715 characterised by interfacing components, e.g. fluidic, electrical, optical or mechanical interfaces
• CPC Class Codes: G01N 2021/0325 Cells for testing reactions, e.g. containing reagents
• CPC Class Codes: G01N 2021/0328 Arrangement of two or more cells having different functions for the measurement of reactions
• CPC Class Codes: G01N 2021/6482 Sample cells, cuvettes
• CPC Class Codes: G01N 21/0303 Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment G01N21/031 - G01N21/15 take precedence
• CPC Class Codes: G01N 21/253 for batch operation, i.e. multisample apparatus analytical automats G01N35/00
• CPC Class Codes: G01N 21/55 Specular reflectivity
• CPC Class Codes: G01N 21/552 Attenuated total reflection
• CPC Class Codes: G01N 21/648 using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
• CPC Class Codes: G01N 21/78 producing a change of colour
• CPC Class Codes: G01N 21/8483 Investigating reagent band test-element handling not specific to a test method G01N33/4875; analytical elements specific to chemical analysis of biological material G01N33/52; autometer with reagent band G01N35/04
• CPC Class Codes: G01N 33/54326 Magnetic particles
• CPC Class Codes: G01N 33/54373 involving physiochemical end-point determination, e.g. wave-guides, FETS, gratings

Abstract

A first output light beam (L2) that originates from a total internal reflection at a detection surface (111) of a total internal reflection TIR chamber (110) and a second output light beam (L2′) that comes from the interior of an inspectable chamber (120, 220, 320, 420, 520, 620) are both received within an observation region (OR). Preferably, these output light beams are detected with the same light detector, e.g. an image sensor (12). A total internal reflection at the TIR chamber and reflected light from inside the inspectable chamber are both directed to the same observation region (OR). This is for example enabled by different inclinations of the windows encountered by the first and the second output light beams, by different optical elements (407) in the paths of the output light beams, and/or by light scattering surface structures (122, 223, 322, 422, 522, 622) in the inspectable chamber.

Claims

1. A sensor apparatus for optical examination of a sample, comprising:

a cartridge including a first sample chamber and a second sample chamber;

at least one light source configured to irradiate the first sample chamber with a first input light beam and the second sample chamber with a second input light beam;

wherein the first sample chamber and a direction of the first input light beam are configured such that the first input light beam is reflected from the first sample chamber by total internal reflection to form a first output light beam;

wherein the second sample chamber is configured to reflect the second input light beam from an interior of the second sample chamber to form a second output light beam;

a light detector configured to convert light received on a single image plane into an electrical signal for analysis by an analysis unit;

at least one optical element configured to direct the first output light beam and the second output light beam to said single light detection surface such that the first output light beam and the second output light beam are detected with the same light detector.

2. The sensor apparatus according to claim 1, wherein the light detector includes a camera and the first and second output beams are received and mapped onto different regions of the image plane of the detector.

3. The sensor apparatus according to claim 1, wherein the first sample chamber and the second sample chamber are illuminated with input light beams that are parallel to each other.

5. The sensor apparatus according to claim 1, wherein the at least one light source is configured to direct the first and second input light beams along parallel paths to the first and second sample chambers, respectively.

6. The sensor apparatus according to claim 1, wherein first and second output light beams are non-parallel as they leave the first and second sample chambers and the optical element includes a prism structure which redirects one of the first and second output light beams relative to the other of the first and second output light beams.

4. A sensor apparatus for optical examination of a sample, comprising:

a cartridge including a first sample chamber and a second sample chamber;

at least one light source configured to irradiate the first sample chamber with a first input light beam and the second sample chamber with a second input light beam;

wherein the first sample chamber and a direction of the first input light beam are configured such that the first input light beam is reflected from the first sample chamber by total internal reflection to form a first output light beam;

wherein the second chamber includes a light scattering surface having color changing reagents adapted for detection of a range of analytes and is configured to reflect the second input light beam from an interior of the second sample chamber to form a second output light beam;

a light detector configured to convert light received on a single image plane into an electrical signal for analysis by an analysis unit;

at least one optical element configured to direct the first output light beam and the second output light beam to said single light detection surface such that the first output light beam and the second output light beam are detected with the same light detector.