Intelligent electronic device with constant calibration capabilities for high accuracy measurements

• US 9,989,618 B2
• Filed: 03/14/2013
• Issued: 06/05/2018
• Est. Priority Date: 04/03/2007
• Status: Active Grant

• Current Assignee: EI Electronics LLC (Hubbell, Inc.)
• Original Assignee: Electro Industries/Gaugetech
• Inventors: Spanier, Joseph, Zhu, Hai
• Primary Examiner(s): Suglo, Janet
• Application Number:
  US13/826,345
• Publication Number:
  US 20130191053A1
• Time in Patent Office: 1,909 Days
• CPC Class Codes: G01R 22/10 using digital techniques
• CPC Class Codes: G01R 35/005 Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references G01R33/0035, G01R35/002 take precedence

Abstract

An intelligent electronic device with constant calibration capabilities for high accuracy measurements and method thereof are provided. The intelligent electronic device presented herein constantly samples the output of at least one signal from a sensor and at least three reference signals, where the reference signals include a high reference signal, a low reference signal, and a medium reference signal. Using the constant calibration implementations provided, the intelligent electronic device can calibrate and compensate a signal from a sensor in real time. The constant calibration implementations provided are independent of time and temperature, and are advantageous in a rapidly changing environment. Furthermore, the constant calibration implementations provided enable the intelligent electronic device to track changes in an applied correction factor for traceability in the error correction process. The intelligent electronic device can determine, when the correction factor is applied, how often, and temporary drifts in accuracy.

Claims

1. An intelligent electronic device (IED) comprising:

at least one sensor configured to measure at least one parameter of an electrical distribution system and output a signal indicative of the measured at least one parameter;

a reference source configured to provide at least three reference voltage signals, each of the at least three reference voltage signals having a different predetermined value;

at least one switch configured to receive the output signal of the at least one sensor and the at least three reference voltage signals and to selectively output the received signals, sequentially and repeatedly;

at least one analog-to-digital converter configured to receive the selectively outputted signals, sequentially sample each of the selectively outputted signals, and convert each sample to a digital sample; and

at least one processing device configured to determine a gain and an offset based on the samples of the at least three reference voltage signals, wherein the offset is a middle value of the at least three reference voltage values and the gain is calculated using the following formula;

gain=(a range of a highest reference signal value to the lowest reference signal value)/(highest measured reference signal value−

lowest measured reference signal value), and

the at least one processing device is further configured to calibrate each of the samples of the outputted signal of the at least one sensor with the gain and offset based on the samples of the at least three reference voltage signals.

2. The IED of claim 1, further comprising a conditioning circuit coupled to the at least one switch and the at least one analog-to-digital converter, the conditioning circuit configured to receive the selectively outputted signals from the at least one switch and to perform at least one of level shifting, linearization with a predetermined gain, filtering, and impedance matching on the received signals.

3. The IED of claim 1, wherein the reference source is a voltage reference integrated circuit chip.

4. The IED of claim 1, wherein the predetermined values of the at least three reference voltage signals are 2.0 Volts, a 0.0 Volts, and a −

2.0 Volts.

5. The IED of claim 1, wherein the at least one processing device calculates each calibrated sample of each sample of the outputted signal of the at least one sensor in each repeat cycle using the following formula:

calibrated sample=gain x (sample of the at least one sensor in the repeat cycle-offset).

6. The IED of claim 1, wherein the at least one parameter is one of voltage and current.

7. The IED of claim 1, wherein the at least one sensor, the reference source, the at least one switch, the at least one analog to digital converter, and the at least one processing device are configured in a socket-type meter form.

8. The IED of claim 1, wherein the at least one sensor, the reference source, the at least one switch, the at least one analog-to-digital converter and the at least one processing device are configured in a panel mounted meter form.

9. The IED of claim 1 wherein the at least one sensor, the reference source, the at least one switch, the at least one analog-to-digital converter and the at least one processing device are configured in a switchboard meter form.

10. The IED of claim 1, wherein the at least one sensor, the reference source, the at least one switch, the at least one analog-to-digital converter and the at least one processing device are configured in a A-base front wired meter form.

11. The IED as in claim 1, wherein the at least one sensor, the reference source, the at least one switch, the at least one analog-to-digital converter and the at least one processing device are configured in a circuit breaker mounted meter form.

12. The IED of claim 1, wherein the at least one analog-to-digital converter is configured to sample the output signals of the at least three reference voltage signals and the at least one output signal of the at least one sensor according to a repeat cycle, the repeat cycle comprising sequentially sampling the output signals of the at least three reference voltage signals each for a first time interval, and then sampling the output signals of the at least one sensor for a second time interval, the second time interval greater than the first time interval.

13. The IED of claim 1, wherein the at least one analog-to-digital converter is configured to sample the output signals of the at least three reference voltage signals and the at least one output signal of the at least one sensor according to a repeat cycle, the repeat cycle comprising sampling the output signals of the at least one sensor and the output signals of the at least three reference signals each for a first time interval.

14. An intelligent electronic device (IED) comprising:

at least one sensor configured to measure at least one parameter of an electrical distribution system and output a signal indicative of the measured at least one parameter;

a reference source configured to provide at least three reference voltage signals, each of the at least three reference voltage signals having a different predetermined value;

at least one switch configured to receive the output signal of the at least one sensor and the at least three reference voltage signals and to selectively output the received signals, sequentially and repeatedly;

at least one analog-to-digital converter configured to receive the selectively outputted signals, sequentially sample each of the selectively outputted signals according to a sampling rate, wherein the sampling rate equals;

(a predetermined sampling rate of the IED) x (1 +the number of reference voltage signals), and

the at least one analog-to-digital converter is further configured to convert each sample to a digital sample; and

at least one processing device configured to calibrate each of the samples of the outputted signal of the at least one sensor based on the samples of the at least three reference voltage signals.

15. The IED of claim 14, wherein the reference source is a voltage reference integrated circuit chip.

16. The IED of claim 14, wherein the at least one analog-to-digital converter is configured to sample the output signals of the at least three reference voltage signals and the at least one output signal of the at least one sensor according to a repeat cycle, the repeat cycle comprising sequentially sampling the output signals of the at least three reference voltage signals each for a first time interval, and then sampling the output signals of the at least one sensor for a second time interval, the second time interval greater than the first time interval.

17. The IED of claim 14, wherein the at least one analog-to-digital converter is configured to sample the output signals of the at least three reference voltage signals and the at least one output signal of the at least one sensor according to a repeat cycle, the repeat cycle comprising sampling the output signals of the at least one sensor and the output signals of the at least three reference signals each for a first time interval.

18. The IED of claim 14, wherein the at least one processing device calibrates the output signals of the at least one sensor based on a gain and an offset determined based on the at least three reference voltage signals.

19. The IED of claim 14, wherein the at least one parameter is one of voltage and current.

20. The IED of in claim 14, wherein the at least one sensor, the reference source, the at least one switch, the at least one analog-to-digital converter and the at least one processing device are configured in at least one of a socket-type meter form, a panel mounted meter form, a switchboard meter form, a A-base front wired meter form and a circuit breaker mounted meter form.

21. An intelligent electronic device (IED) comprising:

at least one sensor configured to measure at least one parameter of an electrical distribution system and output a signal indicative of the measured at least one parameter;

a reference source configured to provide at least two reference voltage signals, each of the at least two reference voltage signals having a different predetermined value;

at least one switch configured to receive the output signal of the at least one sensor and the at least two reference voltage signals and to selectively output the received signals, sequentially and repeatedly;

at least one analog-to-digital converter configured to receive the selectively outputted signals, sequentially sample each of the selectively outputted signals, and convert each sample to a digital sample; and

at least one processing device configured to determine a gain based on the samples of the at least two reference voltage signals, wherein the gain is calculated using the following formula;

gain=(a range of a highest reference signal value to the lowest reference signal value)/(highest measured reference signal value−

lowest measured reference signal value), and

the at least one processing device is further configured to calibrate each of the samples of the outputted signal of the at least one sensor with the gain based on the samples of the at least two reference voltage signals.

22. The IED of claim 21, wherein the reference source is a voltage reference integrated circuit chip.

23. The IED of claim 21, wherein the at least one analog-to-digital converter is configured to sample the output signals of the at least two reference voltage signals and the at least one output signal of the at least one sensor according to a repeat cycle, the repeat cycle comprising sequentially sampling the output signals of the at least two reference voltage signals each for a first time interval, and then sampling the output signals of the at least one sensor for a second time interval, the second time interval greater than the first time interval.

24. The IED of claim 21, wherein the at least one analog-to-digital converter is configured to sample the output signals of the at least two reference voltage signals and the at least one output signal of the at least one sensor according to a repeat cycle, the repeat cycle comprising sampling the output signals of the at least one sensor and the output signals of the at least two reference signals each for a first time interval.

25. The IED of claim 21, wherein the at least one processing device further calibrates the output signals of the at least one sensor based on an offset determined based on the at least two reference voltage signals.

26. The IED of claim 21, wherein the at least one parameter is one of voltage and current.

27. The IED as in claim 21, wherein the at least one sensor, the reference source, the at least one switch, the at least one analog-to-digital converter and the at least one processing device are configured in at least one of a socket-type meter form, a panel mounted meter form, a switchboard meter form, a A-base front wired meter form and a circuit breaker mounted meter form.

28. The IED of claim 21, wherein the predetermined values of the at least two reference voltage signals are 2.0 Volts and a −

2.0 Volts.