Temperature compensated compound resonator

• US 9,991,869 B2
• Filed: 10/05/2015
• Issued: 06/05/2018
• Est. Priority Date: 10/03/2014
• Status: Active Grant

• Current Assignee: Teknologian tutkimuskeskus VTT Oy
• Original Assignee: Teknologian tutkimuskeskus VTT Oy
• Inventors: Jaakkola, Antti, Pekko, Panu, Prunnila, Mika, Pensala, Tuomas
• Primary Examiner(s): San Martin, Edgardo
• Application Number:
  US14/874,514
• Publication Number:
  US 20160099702A1
• Time in Patent Office: 974 Days
• CPC Class Codes: H03H 2009/02527 Combined
• CPC Class Codes: H03H 2009/241 Bulk-mode MEMS resonators
• CPC Class Codes: H03H 2009/2442 Square resonators
• CPC Class Codes: H03H 9/02448 of temperature influence
• CPC Class Codes: H03H 9/0538 Constructional combinations of supports or holders with electromechanical or other electronic elements
• CPC Class Codes: H03H 9/2405 of microelectro-mechanical resonators

Abstract

The invention concerns microelectromechanical resonators. In particular, the invention provides a resonator comprising a support structure, a doped semiconductor resonator suspended to the support structure by at least one anchor, and actuator for exciting resonance into the resonator. According to the invention, the resonator comprises a base portion and at least one protrusion extending outward from the base portion and is excitable by said actuator into a compound resonance mode having temperature coefficient of frequency (TCF) characteristics, which are contributed by both the base portion and the at least one protrusion. The invention enables simple resonators, which are very well temperature compensated over a wide temperature range.

Claims

1. A microelectromechanical resonator device comprising;

a support structure,

an actuator,

a doped semiconductor resonator, wherein the resonator has a base portion and at least one protrusion extending from the base portion, and wherein the resonator is excitable by said actuator into a compound resonance mode having temperature coefficient of frequency (TCF) characteristics which are contributed by both the base portion and the at least one protrusion, and

at least one anchor suspending the resonator to the support structure.

2. The resonator device according to claim 1, wherein the compound resonance mode essentially comprises a first resonance mode in said base portion, the first resonance mode having first TCF characteristics, and a second resonance mode different from the first resonance mode in said at least one protrusion, the second resonance mode having second TCF characteristics, the second TCF characteristics being different from the first TCF characteristics.

3. The resonator device according to claim 1, wherein the compound resonance mode essentially comprises a bulk acoustic wave (BAW) resonance mode in said main portion and a flexural resonance mode in the at least one protrusion.

4. The resonator device according to claim 1, wherein TCFs of the base portion and the at least one protrusion have opposite signs within at least one temperature region.

5. The resonator device according to claim 1, wherein the base portion comprises a rectangular plate having an aspect ratio higher than one.

6. The resonator device according to claim 1, wherein there are at least four protrusions extending from the base portion of the resonator.

7. The resonator device according to claim 1, wherein the at least one protrusion comprises a flexural beam having a longitudinal axis not coinciding with a main axis of the base portion.

8. The resonator device according to claim 1, wherein the protrusions comprise a plurality of flexural beams protruding from the base portion at different lateral directions, the angle of each beam with respect to a main axis of the base portion being 20-70°

.

9. The resonator device according to claim 1, wherein the protrusions comprise a plurality of flexural beams each protruding from the base portion in the lateral direction of one of the main axes of the base portion.

10. The resonator device according to claim 1, further comprising a plurality of said protrusions symmetrically arranged around the main portion.

11. The resonator device according to claim 1, further comprising two or more of said anchor elements extending between the support structure and two or more nodal points of the base portion in said compound resonance mode.

12. The resonator device according to claim 1, wherein

the base portion of the resonator element is a rectangular plate having an aspect ratio greater than 1, and with one main axis directed along a crystal direction of the semiconductor material of the resonator within the limits of +/−

5°

, and

the protrusions comprise four or more flexural beams symmetrically arranged at the perimeter of the base portion and being directed essentially along the crystal direction of the semiconductor material within the limits of +/−

5°

.

13. The resonator device according to claim 1, wherein the compound resonance mode essentially comprises a width-extensional (WE) bulk acoustic wave (BAW) mode in said base portion and a flexural mode in said at least one protrusion.

14. The resonator device according to claim 1, wherein the compound resonance mode essentially comprises a length-extensional (LE) bulk acoustic wave (BAW) mode in said base portion and a flexural mode in said at least one protrusion.

15. The resonator device according to claim 1, wherein the compound resonance mode essentially comprises a Lamé

bulk acoustic wave (BAW) mode in said base portion and a flexural mode in said at least one protrusion.

16. The resonator device according to claim 1, wherein the compound resonance mode, the at least one protrusion is arranged to resonate at a different frequency than the base portion.

17. The resonator device according to claim 1, wherein the resonator further comprises a monolithic silicon matrix doped with an n-type doping agent to an average doping concentration of at least 2.3*10¹⁹ cm⁻

3 of the doping concentration being essentially homogeneous over the resonator.

18. The resonator device according to claim 1, wherein the overall TCF of the resonator is within 10 ppm over a temperature range of at least 50°

C.