Contactor for semiconductor IC testers
First Claim
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1. The ornamental design for a contactor for semiconductor IC testers, as shown and described.
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1 Claim
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1. The ornamental design for a contactor for semiconductor IC testers, as shown and described.
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Current AssigneeAdvantest Corporation
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Original AssigneeAdvantest Corporation
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InventorsMatsumura, Shigeru
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Primary Examiner(s)Vinson, Brian N.
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Application NumberUS29/109,357Time in Patent Office438 DaysField of SearchD13/182, D13/147, D13/184, D10/75, 257/48, 257/690, 257/692, 257/693, 257/697US Class CurrentD13/182CPC Class CodesN/A
