Test meter

• US D595,415 S1
• Filed: 11/17/2008
• Issued: 06/30/2009
• Est. Priority Date: 05/19/2008
• Status: Active Grant

• Current Assignee: ARKRAY, Inc
• Original Assignee: ARKRAY, Inc
• Inventors: Fukuzawa, Masahiro
• Primary Examiner(s): Delehanty; Robert A.
• Assistant Examiner(s): Cavanna; Mark
• Application Number:
  US29/327,968
• Time in Patent Office: 225 Days
• Field of Search: D24/169, D24/186, D24/231, D10/81, 600/301, 600/309, 600/316, 600/318, 600/322, 600/324, 600/347, 600365-366, 600/368, 600583-584, 422 55- 56, 422/58, 422/61, 422/68.1, 422/102, 436 66- 68
• US Class Current: D24/186
• CPC Class Codes: N/A

Claims

1. The ornamental design for a test meter, as shown and described.