X-ray production apparatus for inspection tour

• US D617,906 S1
• Filed: 06/18/2008
• Issued: 06/15/2010
• Est. Priority Date: 03/12/2008
• Status: Active Grant

• Current Assignee: Shimadzu Corporation
• Original Assignee: Shimadzu Corporation
• Inventors: Nakamura, Toshiaki, Miyata, Hiroshi, Nakahara, Tadahiko, Muraoka, Hiroshi
• Primary Examiner(s): Nelson; T. Chase
• Assistant Examiner(s): Doan; Anhdao
• Application Number:
  US29/320,020
• Time in Patent Office: 727 Days
• Field of Search: D24158-161, D24/183, D24/186, 378/4, 378/15, 378/17, 378/19, 378/20, 378 21- 27, 378 38- 40, 378/102, 378/146, 378/195, 378/197, 378/198, 600/409, 600/410, 600/425, 600/476
• US Class Current: D24/158
• CPC Class Codes: N/A

Claims

1. The ornamental design for an X-ray production apparatus for inspection tour, as shown and described.