Substrate for spectroscopic analysis

• US D750,799 S1
• Filed: 06/01/2015
• Issued: 03/01/2016
• Est. Priority Date: 07/05/2013
• Status: Active Grant

• Current Assignee: Hamamatsu Photonics KK
• Original Assignee: Hamamatsu Photonics KK
• Inventors: Ito, Masashi, Shibayama, Katsumi, Ofuji, Kazuto, Oyama, Hiroki, Maruyama, Yoshihiro
• Primary Examiner(s): Nelson, T. Chase
• Assistant Examiner(s): Cavanna, Mark
• Application Number:
  US29/528,795
• Time in Patent Office: 274 Days
• Field of Search: D24/216, D24222-226, D24/231, D24/232, D24/169, D10/80, D10/81, 422500-504, 422/68.1, 422/69, 422560-566, 435/288.1, 435/288.3, 435/289.1, 435/283.1, 436/174, 436/180
• US Class Current: D24/225
• CPC Class Codes: N/A

Claims

1. The ornamental design for a substrate for spectroscopic analysis, as shown and described.