Semiconductor yield management system and method
First Claim
Patent Images
1. A computerized yield management system, comprising:
- pre-processing computing device means executed by a data pre-processor in a computer processing unit for pre-processing an input data set comprising one or more prediction variables and one or more response variables containing data about a particular semiconductor process, the pre-processing computing device means further comprising means for removing one or more prediction variables from the input data set having more than a predetermined number of missing values, means for removing one or more prediction variables from the input data set having more than a predetermined number of classes, and means for removing data having more than a predetermined number of missing values to generate pre-processed data;
model generating computer device means executed by a model builder in the computer processing unit, the model builder being in communication with the data pre-processor, for generating a model based on the pre-processed data, the model being a decision tree;
computing device means executed by the model builder for modifying the model based on user input; and
computing device means executed by a statistical tool library in the computer processing unit, the statistical tool library being in communication with the model builder, for analyzing the model using a statistical tool to generate one or more key yield factors based on the input data set.
2 Assignments
0 Petitions
Accused Products
Abstract
A system and method for yield management is disclosed wherein a data set containing one or more prediction variable values and one or more response values is input into the system. The system can pre-process the input data set to remove prediction variables with missing values and data sets with missing values. The pre-processed data can then be used to generate a model that may be a decision tree. The system can accept user input to modify the generated model. Once the model is complete, one or more statistical analysis tools can be used to analyze the data and generate a list of the key yield factors for the particular data set.
5 Citations
34 Claims
-
1. A computerized yield management system, comprising:
-
pre-processing computing device means executed by a data pre-processor in a computer processing unit for pre-processing an input data set comprising one or more prediction variables and one or more response variables containing data about a particular semiconductor process, the pre-processing computing device means further comprising means for removing one or more prediction variables from the input data set having more than a predetermined number of missing values, means for removing one or more prediction variables from the input data set having more than a predetermined number of classes, and means for removing data having more than a predetermined number of missing values to generate pre-processed data; model generating computer device means executed by a model builder in the computer processing unit, the model builder being in communication with the data pre-processor, for generating a model based on the pre-processed data, the model being a decision tree; computing device means executed by the model builder for modifying the model based on user input; and computing device means executed by a statistical tool library in the computer processing unit, the statistical tool library being in communication with the model builder, for analyzing the model using a statistical tool to generate one or more key yield factors based on the input data set. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
-
-
12. A yield management method, comprising:
-
pre-processing, via a computing device, an input data set comprising one or more prediction variables and one or more response variables containing data about a particular semiconductor process, the pre-processing further comprising removing one or more prediction variables from the input data set having more than a predetermined number of missing values, removing one or more prediction variables from the input data set having more than a predetermined number of classes and removing data having more than a predetermined number of missing values to generate pre-processed data; generating, via the computing device, a model based on the pre-processed data, the model being a decision tree; modifying, via the computing device, the model based on user input; and analyzing, via the computing device, the model using statistical tools to examine one or more key yield factors based on the input data set. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
-
-
23. A computerized yield management system, comprising:
-
pre-processing computing device means executed by a data pre-processor in a computer processing unit for pre-processing an input data set comprising one or more prediction variables and one or more response variables containing data about a particular semiconductor process to remove data having at least a predetermined number of missing values to generate pre-processed data, and the pre-processing computing device means comprising means for removing one or more prediction variables from the input data set having more than a predetermined number of classes; computing device means executed by a model builder in the computer processing unit, the model builder being in communication with the data pre-processor, for generating a model based on the pre-processed data, the model being a decision tree identifying one or more variables as key yield factors; and computing device means executed by a statistical tool library in the computer processing unit, the statistical tool library being in communication with the model builder, for analyzing the model using a statistical tool to examine one or more key yield factors based on the input data set. - View Dependent Claims (24, 25, 26)
-
-
27. A yield management method, comprising:
-
pre-processing, via a computing device, an input data set comprising one or more prediction variables and one or more response variables containing data about a particular semiconductor process to remove data having at least a predetermined number of missing values to generate pre-processed data, the pre-processing further comprising removing one or more prediction variables from the input data set having more than a predetermined number of classes; generating, via the computing device, a model based on the pre-processed data, the model being a decision tree identifying one or more variables as key yield factors; and analyzing the model using a statistical tool to examine one or more key yield factors based on the input data set. - View Dependent Claims (28, 29, 30)
-
-
31. A computerized yield management system, comprising:
-
pre-processing computing device means executed by a data pre-processor in a computer processing unit for pre-processing an input data set comprising one or more prediction variables and one or more response variables containing data about a particular semiconductor process to remove data having at least a predetermined number of missing values to generate pre-processed data, and the pre-processing computing device means comprising means for removing one or more prediction variables from the input data set having more than a predetermined number of classes; computing device means executed by a model builder in the computer processing unit, the model builder being in communication with the data pre-processor, for generating a model based on the pre-processed data, the model being a decision tree identifying one or more variables as key yield factors; and computing device means executed by a statistical tool in the computer processing unit, the statistical tool being in communication with the model builder, for analyzing the model using the statistical tool to generate yield management information. - View Dependent Claims (32, 33, 34)
-
Specification