Method for manufacturing reflective mask blank, and method for manufacturing reflective mask
First Claim
1. A method of manufacturing a reflective mask blank comprising a multilayer reflective film formed on a substrate so as to reflect EUV light;
- and a laminated film formed on the multilayer reflective film;
the method comprising the steps of;
depositing the multilayer reflective film on the substrate to form a multilayer reflective film formed substrate;
carrying out first defect inspection for the multilayer reflective film formed substrate in which no fiducial mark is formed;
depositing the laminated film on the multilayer reflective film of the multilayer reflective film formed substrate;
forming a fiducial mark for an upper portion of the laminated film to thereby form a reflective mask blank comprising the fiducial mark, the fiducial mark serving as a reference for a defect position in defect information; and
carrying out second defect inspection of the reflective mask blank by using the fiducial mark as a reference.
1 Assignment
0 Petitions
Accused Products
Abstract
A method of manufacturing a reflective mask blank comprising a multilayer reflective film formed on a substrate so as to reflect EUV light; and a laminated film formed on the multilayer reflective film. The method includes the steps of depositing the multilayer reflective film on the substrate to form a multilayer reflective film formed substrate; carrying out defect inspection for the multilayer reflective film formed substrate; depositing the laminated film on the multilayer reflective film of the multilayer reflective film formed substrate; forming a fiducial mark for an upper portion of the laminated film to thereby form a reflective mask blank comprising the fiducial mark, the fiducial mark serving as a reference for a defect position in defect information; and carrying out defect inspection of the reflective mask blank by using the fiducial mark as a reference.
4 Citations
11 Claims
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1. A method of manufacturing a reflective mask blank comprising a multilayer reflective film formed on a substrate so as to reflect EUV light;
- and a laminated film formed on the multilayer reflective film;
the method comprising the steps of; depositing the multilayer reflective film on the substrate to form a multilayer reflective film formed substrate; carrying out first defect inspection for the multilayer reflective film formed substrate in which no fiducial mark is formed; depositing the laminated film on the multilayer reflective film of the multilayer reflective film formed substrate; forming a fiducial mark for an upper portion of the laminated film to thereby form a reflective mask blank comprising the fiducial mark, the fiducial mark serving as a reference for a defect position in defect information; and carrying out second defect inspection of the reflective mask blank by using the fiducial mark as a reference. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
- and a laminated film formed on the multilayer reflective film;
Specification