Serial weak FBG interrogator using pulses of differing wavelengths

• US 10,234,346 B2
• Filed: 05/17/2017
• Issued: 03/19/2019
• Est. Priority Date: 11/27/2012
• Status: Active Grant

• Current Assignee: Sentek Instrument, LLC
• Original Assignee: Sentek Instrument, LLC
• Inventors: Dong, Bo, Shen, Fabin, Wang, Anbo
• Primary Examiner(s): Lee, Hwa Andrew
• Application Number:
  US15/597,539
• Publication Number:
  US 20170248480A1
• Time in Patent Office: 671 Days
• CPC Class Codes: E21B 47/135 using light waves, e.g. infrared or ultraviolet waves
• CPC Class Codes: G01D 18/00 Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
• CPC Class Codes: G01D 5/35312 using a Fabry Perot
• CPC Class Codes: G01D 5/35316 using a Bragg gratings
• CPC Class Codes: G01L 1/246 using integrated gratings, e.g. Bragg gratings

Abstract

A serial weak FBG interrogator is disclosed. The serial weak FBG interrogator may include a CW tunable laser or pulsed laser utilized as a laser source and an EDFA. The serial weak FBG interrogator may also be an interrogation of a single sensor system by utilization of a DFB laser which utilizes a single sensor, which may be an interferometer sensor, an extrinsic Fabry-Perot interferometer or a wavelength-modulated sensor. The serial weak FBG interrogator may also include a computer system or CSPU.

Claims

1. An interrogation system using a laser to interrogate at least one sensor, said interrogation system comprising:

at least one sensor capable of reflecting or transmitting light from said laser;

an optical fiber extending from the at least one sensor; and

a sensor interrogator receiving the optical fiber extending from the at least one sensor, wherein the sensor interrogator includes the laser, an electro-optical shutter or pulse generator laser driver developing pulses of light from said laser at each of a plurality of wavelengths having a repetition rate based on a time of flight of light in an optical fiber providing light from said laser to said one or more sensors, a laser calibrator comprising a first photodetector and a first amplifier, and wherein said sensor interrogator further comprises a second photodetector receiving reflected laser output from said sensor, a second amplifier, an A/D converter responsive to said first amplifier and said second amplifier and a microprocessor responsive to said A/D converter for determining a spectrum of said pulses of light from said laser reflected by said at least one sensor, wherein said electro-optical shutter or pulse generator laser driver provides pulses of light at respective different wavelengths to said laser calibrator and said at least one sensor.

2. The interrogation system according to claim 1, wherein the at least one sensor is an interferometer sensor.

3. The interrogation system according to claim 2, wherein the at least one sensor is a Fabry-Perot interferometer.

4. The interrogation system according to claim 3, wherein the at least one sensor is an extrinsic Fabry-Perot interferometer.

5. The interrogation system according to claim 2, wherein said wavelength modulated sensor is a Fiber Bragg Grating (FBG).

6. The interrogation system according to claim 1, wherein said laser is a continuous wave (CW) wavelength tunable laser and said interrogation system further includes an electro-optic light modulator.

7. The interrogation system according to claim 1, wherein said laser is a wavelength tunable pulsed laser.

8. The interrogation system according to claim 1, wherein said laser is a distributed feedback (DFB) laser.

9. The interrogation system according to claim 1, wherein said laser is a vertical cavity surface emitting laser (VCSEL).

10. The interrogation system according to claim 1, wherein said at least one sensor comprises a plurality of sensors arranged in series along said optical fiber.

11. The interrogation system according to claim 10, further including a multiplexing arrangement to interrogate said plurality of sensors individually or in groups wherein said multiplexing arrangement is one of wavelength division multiplexing, time division multiplexing, optical frequency domain multiplexing or a combination thereof.

12. The interrogation system according to claim 10, wherein said plurality of sensors are interferometer sensors having the same or different optical path distances.

13. The interrogation system according to claim 12, wherein said microprocessor reconstructs fringes corresponding to respective ones of said different optical path differences.

14. The interrogation system according to claim 12,

wherein said processor computes the optical path differences or the optical path difference changes of said interferometers.

15. The interrogation system according to claim 10, wherein said plurality of sensors are wavelength-modulated sensors having the same or different reflection or transmission wavelengths.

16. The interrogation system according to claim 15, wherein said microprocessor computes transmissive or reflective wavelengths of said sensors.

17. The interrogation system according to claim 1, wherein said at least one sensor comprises a plurality of sensors arranged in parallel with an optical fiber extending from each said sensor, wherein optical path differences of respective optical fibers extending from respective sensors are the same or different from each other.

18. The interrogation system as recited in claim 1 wherein said electro-optical shutter is of a type that provides optical gain.

20. The sensor interrogator according to claim 17, wherein said one or more sensors include a plurality of sensors, said interrogator further including a multiplexing arrangement for individually interrogating respective sensors of said plurality of sensors.

21. The sensor interrogator according to claim 17, wherein said sensors are arranged in parallel and communicate with said sensor interrogator over separate optical fibers of different lengths.

19. A sensor interrogator for interrogating one or more sensors having a variable length optical path difference responsive to a variable parameter to be measured, said interrogator comprising:

a continuous wave tunable laser;

an electro-optical shutter or pulse generator laser driver developing pulses of light from said continuous wave tunable laser having a repetition rate based on a time of flight of light in an optical fiber providing light from said laser to said one or more sensors;

a laser calibrator comprising a first photodetector and a first amplifier;

a second photodetector receiving reflected laser output from said one or more sensors over an optical fiber;

a second amplifier;

an A/D converter responsive to said first amplifier and said second amplifier;

and a microprocessor responsive to said A/D converter for determining a spectrum of said output from said laser reflected by respective ones of said one or more sensors.

22. The interrogation system as recited in claim 19 wherein said electro-optical shutter is of a type that provides optical gain.