Aging determination of power semiconductor device in electric drive system
First Claim
Patent Images
1. A method of monitoring aging in an electric drive system comprising:
- energizing the electric drive system such that electrical current flows through a power semiconductor device in the electric drive system;
determining a value indicative of a voltage across the power semiconductor device while providing a level of the electrical current where the voltage is substantially independent of a temperature of the power semiconductor device;
comparing the determined value with a reference value; and
outputting a signal indicative of an aging state of the power semiconductor device responsive to a difference between the determined value and the reference value.
2 Assignments
0 Petitions
Accused Products
Abstract
Monitoring aging in an electric drive system includes energizing the electric drive system such that electrical current flows through a power semiconductor device therein, determining a value indicative of a voltage across the power semiconductor device, at a current level where voltage is substantially independent of temperature, comparing the determined value with a reference value, and outputting a signal responsive to a difference between the values that is indicative of an aging state of the power semiconductor device.
12 Citations
29 Claims
-
1. A method of monitoring aging in an electric drive system comprising:
-
energizing the electric drive system such that electrical current flows through a power semiconductor device in the electric drive system; determining a value indicative of a voltage across the power semiconductor device while providing a level of the electrical current where the voltage is substantially independent of a temperature of the power semiconductor device; comparing the determined value with a reference value; and outputting a signal indicative of an aging state of the power semiconductor device responsive to a difference between the determined value and the reference value. - View Dependent Claims (2, 3, 4, 5, 6, 26, 27)
-
-
7. A method of determining health of power semiconductor devices in an electric drive system comprising:
-
energizing the electric drive system such that electrical current flows through a power semiconductor device therein at a first level where a relation between electrical current level and voltage across the power semiconductor device is dependent on temperature; energizing the electric drive system such that electrical current flows through the power semiconductor device at a second level where the relation is substantially independent of temperature; sensing voltage across the power semiconductor device where the electrical current is at the second level; and setting a fault responsive to the sensed voltage. - View Dependent Claims (8, 9, 10, 11)
-
-
12. An electric drive system comprising:
-
a power module for conveying electrical power between an electrical power supply and an external electrical load; a power semiconductor device within the power module; a sensing mechanism having sensing leads coupled to electrical terminals of the power semiconductor device, and a controller coupled to the sensing leads; the controller being structured to determine a value indicative of a voltage across the power semiconductor device when electrical current through the power semiconductor device is at a level where the voltage is substantially independent of a temperature of the power semiconductor device; and the controller being further structured to compare the determined value with a reference value, and to output a signal indicative of an aging state of the power semiconductor device responsive to a difference between the determined value and the reference value. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 28, 29)
-
-
20. A method of monitoring aging in an electric drive system comprising:
-
energizing the electric drive system such that electrical current flows through a power semiconductor device in the electric drive system; determining a value indicative of a voltage across the power semiconductor device, at a level of the electrical current where the voltage is substantially independent of a temperature of the power semiconductor device; comparing the determined value with a reference value; and outputting a signal indicative of an aging state of the power semiconductor device responsive to a difference between the determined value and the reference value; wherein the power semiconductor device includes a transistor and the act of determining includes determining a voltage drop via sensing leads electrically connected to a collector and an emitter of the transistor. - View Dependent Claims (21, 22)
-
-
23. A method of monitoring aging in an electric drive system comprising:
-
energizing the electric drive system such that electrical current flows through a power semiconductor device in the electric drive system; determining a value indicative of a voltage across the power semiconductor device, at a level of the electrical current where the voltage is substantially independent of a temperature of the power semiconductor device; comparing the determined value with a reference value; and outputting a signal indicative of an aging state of the power semiconductor device responsive to a difference between the determined value and the reference value; wherein the power semiconductor device includes a diode and the act of determining includes determining a voltage drop via sensing leads electrically connected to an anode and a cathode of the diode. - View Dependent Claims (24, 25)
-
Specification