×

Apparatus for measurement de-embedding and methods for use therewith

  • US 10,326,494 B2
  • Filed: 12/06/2016
  • Issued: 06/18/2019
  • Est. Priority Date: 12/06/2016
  • Status: Active Grant
First Claim
Patent Images

1. A method for use with a launching device, the method comprising:

  • coupling a calibration apparatus to the launching device, the calibration apparatus including a transmission medium having a first end configured to be coupled to a first port of the launching device, and the calibration apparatus further including a short circuit, coupled to a second end of the transmission medium;

    generating a first microwave signal on a second port of the launching device that causes the launching device to induce electromagnetic waves on an outer surface of the transmission medium, wherein the electromagnetic waves propagate along the outer surface of the transmission medium without requiring an electrical return path to the second end of the transmission medium and wherein the electromagnetic waves are reflected by the short circuit back to the first end of the transmission medium for reception by the launching device as reflected electromagnetic waves at the first port;

    receiving a second microwave signal from the launching device caused by the reflected electromagnetic waves and the first microwave signal; and

    de-embedding the launching device from a microwave system that comprises the launching device and a device under test, wherein the de-embedding of the launching device is based on an analysis of the reflected electromagnetic waves that includes performing an inverse Fourier transform on the second microwave signal to generate a transformed second microwave signal, interpreting portions of the transformed second microwave signal as terms in a power series expansion, finding a first term from the power series expansion and determining a difference between the second microwave signal and the first term from the power series expansion.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×