Wear-out monitor device
First Claim
1. An integrated circuit device comprising a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, the wear-out monitor device comprising a reservoir and a diffusion region, wherein the indication is associated with localized diffusion of a diffusant from the reservoir into the diffusion region in response to a wear-out stress that causes the wear-out of the core circuit.
3 Assignments
0 Petitions
Accused Products
Abstract
The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
92 Citations
43 Claims
- 1. An integrated circuit device comprising a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, the wear-out monitor device comprising a reservoir and a diffusion region, wherein the indication is associated with localized diffusion of a diffusant from the reservoir into the diffusion region in response to a wear-out stress that causes the wear-out of the core circuit.
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18. A method of monitoring wear-out of a core circuit of an integrated circuit device using a wear-out monitor device separated from the core circuit, the wear-out monitor device comprising a reservoir and a diffusion region, the method comprising:
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recording an indication of wear-out of the core circuit, wherein the indication is associated with localized diffusion of a diffusant from the reservoir into the diffusion region within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit; detecting a property that changes in response to the localized diffusion of the diffusant; and reporting the property of the wear-out monitor device. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25)
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26. An integrated circuit device with wear-out monitoring of a core circuit in the integrated circuit device, the integrated circuit device comprising:
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means for recording an indication of wear-out of a core circuit, the core circuit separated from the means for recording, the means for recording comprising a reservoir and a diffusion region, wherein the indication is associated with localized diffusion of a diffusant from the reservoir into the diffusion region within the means for recording in response to a wear-out stress that causes the wear-out of the core circuit; and means for detecting the indication of wear-out of the core circuit, the means for detecting the indication of wear-out being in communication with the means for recording the indication of wear-out. - View Dependent Claims (31, 32, 33, 34, 35, 36)
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37. An integrated circuit device comprising a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device based on diffusion of a charged diffusant, wherein the wear-out monitor device comprises:
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a reservoir comprising the charged diffusant; and a diffusion region in communication with the reservoir such that the wear-out stress causes the charged diffusant to diffuse from the reservoir into the diffusion region. - View Dependent Claims (38, 39, 40, 41, 42, 43)
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Specification