Optical addressing of individual targets in solids

• US 10,416,216 B2
• Filed: 12/11/2013
• Issued: 09/17/2019
• Est. Priority Date: 12/11/2012
• Status: Active Grant

• Current Assignee: Australian National University, University of Melbourne, NewSouth Innovations Pty Limited (University Of New South Wales)
• Original Assignee: Australian National University
• Inventors: Rogge, Sven, Sellars, Matthew John, Yin, Chunming, McCallum, Jeffrey Colin, De Boo, Gabriele Gaetano, Rancic, Milos, Stavrias, Nikolas
• Primary Examiner(s): Koval, Melissa J
• Assistant Examiner(s): Maini, Rahul
• Application Number:
  US14/651,294
• Publication Number:
  US 20150316598A1
• Time in Patent Office: 2,106 Days
• Field of Search: 324300-322
• CPC Class Codes: B82Y 10/00 Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
• CPC Class Codes: G01R 29/24 Arrangements for measuring quantities of charge
• CPC Class Codes: G06N 10/00 Quantum computing, i.e. information processing based on quantum-mechanical phenomena

Abstract

This disclosure concerns photonics and in particular the addressing of individual targets in solids. In aspect one there is provided a device comprising a solid substrate with one or more atomic scale targets in the substrate. A laser light is focused on a region of the substrate that contains a single target to selectively cause photoionization of the target. A charge sensor with sub-electron charge sensitivity is focussed on measuring the charge in the region of the substrate that contains a single target. In use, the device operates such that the laser is turned on to cause photoionization of the target, and the charge sensor detects the change in charge in the region of the substrate that contains the single target. In another aspect is the method for optically investigating individual nuclear spin states of single atoms by investigating both the Zeeman effect and the hyperfine interaction of the single atoms.

Claims

1. A solid state quantum device comprising:

a semiconductor substrate;

one or more waveguides integrated into the semiconductor substrate;

one or more atomic scale impurities located within a select waveguide of the one or more waveguides and being optically coupled to the select waveguide;

a laser light source coupled to the one or more waveguides so that laser light is selectively focussed on the one or more of the atomic scale impurities to cause selective photoionization of one or more of the atomic scale impurities; and

one or more charge sensors with sub-electron charge sensitivity integrated into the select waveguide and arranged to measure a charge variation in a region of the select waveguide that contains the one or more atomic scale impurities that have been photoionized;

wherein, in use, the device operates such that the laser light is turned on to cause photoionization of one or more of the atomic scale impurities, and the one or more charge sensors detect the charge variation in the region of the semiconductor substrate that contains the one or more atomic scale impurities that have been photoionized to perform optical single-shot readout of the electron and nuclear spin of the impurity.

2. The solid state quantum device according to claim 1, wherein the semiconductor substrate comprises silicon, other III/N and II/VI semiconductors, or dielectric crystals.

3. The solid state quantum device according to claim 1, wherein the one or more atomic scale impurities comprise shallow dopants including Phosphorus (P), Arsenic (As), Antimony (Sb), Bismuth (Bi), Boron (B), Indium (In) and Aluminium (Al), or optically active sites including rare earth ions.

4. The solid state quantum device according to claim 1, wherein the laser light is generated from any laser having wavelength(s) at which photoionization occurs.

5. The solid state quantum device according to claim 1, wherein the photoionization occurs via processes, including:

direct photoionization based on a single photon, whether resonant or not;

a two photon process;

a two photon process where at least one or more transitions is resonant;

or,

a resonant excitonic transition that forms a metastable state which decays and leaves the one or more of the atomic scale impurities ionized.

6. The solid state quantum device according to claim 1, wherein the one or more charge sensors comprise a gate of a silicon-on-insulator Single Electron Transistor (SET), or a dielectrics metal SET.

7. The solid state quantum device according to claim 1, wherein geometry of the one or more charge sensors is:

a planar nano transistor;

an accumulation layer Field-Effect Transistor (FET);

a metal Single Electron Transistor (SET) on a dielectric;

a coulomb blockade island charge sensor;

a charge island gate;

or,

a waveguide gate.

8. The solid state Quantum device according to claim 1, comprising a Si based Single Electron Transistor (SET) in form of a Fin-Shaped Field Effect Transistor (FinFET) in which optical centres are embedded.

9. The solid state quantum device according to claim 8, wherein the SET is biased such that a small current flows just below, or above, a charge degeneracy point;

the solid state quantum device is illuminated with the laser light from a single mode optical fibre; and

the laser light is resonant with one or more transitions of the optical centres it photoionizes, such that the laser light changes the charge state of the optical centres which is detected by an increase, or decrease, in current in case of a loss of an electron.

10. The solid, state quantum device according to claim 9, wherein the laser light is used to gain high spectroscopic resolution with access to the electron and nuclear state.

11. A method for operating a solid state quantum device, the method comprising:

coupling one or more waveguides integrated into a semiconductor substrate to one or more atomic scale impurities, the one or more atomic scale impurities being located within a select waveguide of the one or more waveguides;

causing selective photoionization of the one or more of the atomic scale impurities by coupling a laser light source to the one or more waveguides so that laser light is selectively focussed on the one or more of the atomic scale impurities;

detecting a charge variation in a region of the semiconductor substrate that contains the scale impurities that have been photoionized by using one or more charge sensors with sub-electron charge sensitivity integrated into the select waveguide and arranged to measure a charge variation in a region of the select waveguide that contains the one or more atomic scale impurities that have been photoionized to perform optical single-shot readout of the electron and nuclear spin of the one or more atomic scale impurities that have been photoionized.