Method for grading spatial painting, apparatus and system for grading spatial painting

• US 10,452,149 B2
• Filed: 05/31/2016
• Issued: 10/22/2019
• Est. Priority Date: 02/18/2016
• Status: Active Grant

• Current Assignee: Wistron Corporation
• Original Assignee: Wistron Corporation
• Inventors: Xie, Yi-Zhan
• Primary Examiner(s): Mengistu, Amare
• Assistant Examiner(s): Mathews, Crystal
• Application Number:
  US15/168,260
• Publication Number:
  US 20170243060A1
• Time in Patent Office: 1,239 Days
• CPC Class Codes: G06F 1/163 Wearable computers, e.g. on a belt
• CPC Class Codes: G06F 18/22 Matching criteria, e.g. proximity measures
• CPC Class Codes: G06F 3/017 Gesture based interaction, e.g. based on a set of recognized hand gestures interaction based on gestures traced on a digitiser G06F3/04883
• CPC Class Codes: G06F 3/1415 with means for detecting differences between the image stored in the host and the images displayed on the displays
• CPC Class Codes: G06V 40/20 Movements or behaviour, e.g. gesture recognition recognition of facial expressions G06V40/16

Abstract

A method for grading spatial painting, apparatus and system for grading spatial painting are proposed. The method includes: generating a first spatial pattern; recording a moving trace and a plurality of moving parameters of an electronic apparatus and transforming the recorded moving trace into a second spatial pattern; calculating a similarity between the first and the second spatial pattern; and calculating a grade for completing the second spatial pattern according to the moving parameters and the similarity.

Claims

1. A method for grading spatial painting, adapted to an electronic apparatus, and comprising:

generating a first spatial pattern;

recording a moving trace and a plurality of moving parameters of the electronic apparatus and transforming the recorded moving trace into a second spatial pattern, wherein the moving parameters comprise a total moving distance and an average speed;

calculating a similarity between the first spatial pattern and the second spatial pattern;

calculating a complexity for completing the second spatial pattern according to the moving parameters of the electronic apparatus and a difficulty of the first spatial pattern; and

calculating a grade for completing the second spatial pattern according to the moving parameters and the similarity.

2. The method according to claim 1, wherein the step of recording the moving trace and the moving parameters of the electronic apparatus and transforming the recorded moving trace into the second spatial pattern comprises:

starting recording a plurality of coordinates of the electronic apparatus based on a sampling period in response to a start operation, wherein the coordinates form the motiving trace;

stopping recording the coordinates of the electronic apparatus in response to a stop operation;

calculating the total moving distance moved by the electronic apparatus during a period from the start operation to the stop operation according to the coordinates and calculating the average speed of the electronic apparatus during the period according to the total moving distance; and

connecting the coordinates to generate the second spatial pattern.

3. The method according to claim 1, wherein the step of calculating the similarity between the first spatial pattern and the second spatial pattern comprises:

scaling the first spatial pattern into a third spatial pattern and mapping the third spatial pattern to a two-dimensional space;

mapping the second spatial pattern to the two-dimensional space and aligning the second spatial pattern and the third spatial pattern in the two-dimensional space;

creating a plurality of reference lines in the two-dimensional space;

locating a plurality of first reference points on the reference lines intersecting the second spatial pattern and locating a plurality of second reference points on the reference lines intersecting the third spatial pattern;

respectively sorting the first reference points and the second reference points corresponding to an i-th reference line among the reference lines, wherein a number of the first reference points corresponding to the i-th reference line is a first number, and a number of the second reference points corresponding to the i-th reference line is a second number, wherein i is a positive integer;

calculating a distance between a j-th first reference point and a j-th second reference point, wherein j is an integer not greater than a third number, and the third number is a smaller one among the first number and the second number; and

calculating the similarity according to the distance and an area of the third spatial pattern.

4. The method according to claim 3, wherein the step of scaling the first spatial pattern into the third spatial pattern and mapping the third spatial pattern to the two-dimensional space comprises:

calculating a ratio between a first area of the first spatial pattern and a second area of the second spatial pattern, wherein the ratio is greater than 1;

scaling up the first spatial pattern into the third spatial pattern according to the ratio;

mapping the third spatial pattern to the two-dimensional space and setting a center of mass of the third spatial pattern as an origin point of the two-dimensional space;

wherein the step of mapping the second spatial pattern to the two-dimensional space and aligning the second spatial pattern and the third spatial pattern in the two-dimensional space comprises;

mapping the second spatial pattern to the two-dimensional space and moving the second spatial pattern so a center of mass thereof is located at the origin point; and

rotating the second spatial pattern to maximize an overlapping area between the second spatial pattern and the third spatial pattern.

5. The method according to claim 1, wherein the first spatial pattern is a two-dimensional pattern having at least one vertex and at least one region, the moving parameters comprise a height difference and the total moving distance experienced by the electronic apparatus when drawing the second spatial pattern, and the step of calculating the complexity for completing the second spatial pattern according to the moving parameters of the electronic apparatus and the difficulty of the first spatial pattern comprises:

calculating a height difference grade based on the height difference and the total moving distance;

calculating a number of steps for connecting the at least one vertex in one single stroke based on a number of the at least one vertex and a number of the at least one region and deducing the difficulty of the first spatial pattern according to the number of steps; and

calculating the complexity by summing the height difference grade and the difficulty.

6. The method according to claim 1, wherein after the step of calculating the grade for completing the second spatial pattern according to the moving parameters and the similarity, the method further comprises:

correcting the grade by adding the complexity multiplied by a weight to the grade.

7. The method according to claim 1, wherein the step of calculating the grade for completing the second spatial pattern according to the moving parameters and the similarity comprises:

calculating the grade by summing the total moving distance multiplied by a first weight, the average speed multiplied by a second weight and the similarity multiplied by a third weight.

8. An electronic apparatus for grading spatial painting, comprising:

a storage circuit, storing a plurality of modules; and

a processor, coupled to the storage circuit and configured to access the modules to perform the following steps;

generating a first spatial pattern;

recording a moving trace and a plurality of moving parameters and transforming the recorded moving trace into a second spatial pattern, wherein the moving parameters comprise a total moving distance and an average speed;

calculating a complexity for completing the second spatial pattern according to the moving parameters of the electronic apparatus and a difficulty of the first spatial pattern; and

calculating a similarity between the first spatial pattern and the second spatial pattern and calculating a grade for completing the second spatial pattern according to the moving parameters and the similarity.

9. The electronic apparatus according to claim 8, wherein the processor is configured for:

starting recording a plurality of coordinates of the electronic apparatus based on a sampling period in response to a start operation, wherein the coordinates form the motiving trace;

stopping recording the coordinates of the electronic apparatus in response to a stop operation;

calculating the total moving distance moved by the electronic apparatus during a period from the start operation to the stop operation according to the coordinates and calculating the average speed of the electronic apparatus during the period according to the total moving distance; and

connecting the coordinates to generate the second spatial pattern.

10. The electronic apparatus according to claim 8, wherein the processor is configured for:

scaling the first spatial pattern into a third spatial pattern and mapping the third spatial pattern to a two-dimensional space;

mapping the second spatial pattern to the two-dimensional space and aligning the second spatial pattern and the third spatial pattern in the two-dimensional space;

creating a plurality of reference lines in the two-dimensional space;

locating a plurality of first reference points on the reference lines intersecting the second spatial pattern and locating a plurality of second reference points on the reference lines intersecting the third spatial pattern;

respectively sorting the first reference points and the second reference points corresponding to an i-th reference line among the reference lines, wherein a number of the first reference points corresponding to the i-th reference line is a first number, and a number of the second reference points corresponding to the i-th reference line is a second number, wherein i is a positive integer;

calculating a distance between a j-th first reference point and a j-th second reference point, wherein j is an integer not greater than a third number, and the third number is a smaller one among the first number and the second number; and

calculating the similarity according to the distance and an area of the third spatial pattern.

11. The electronic apparatus according to claim 10, wherein the processor is configured for:

calculating a ratio between a first area of the first spatial pattern and a second area of the second spatial pattern, wherein the ratio is greater than 1;

scaling up the first spatial pattern into the third spatial pattern according to the ratio;

mapping the third spatial pattern to the two-dimensional space and setting a center of mass of the third spatial pattern as an origin point of the two-dimensional space;

mapping the second spatial pattern to the two-dimensional space and moving the second spatial pattern so a center of mass thereof is located at the origin point; and

rotating the second spatial pattern to maximize an overlapping area between the second spatial pattern and the third spatial pattern.

12. The electronic apparatus according to claim 8, wherein the first spatial pattern is a two-dimensional pattern having at least one vertex and at least one region, the moving parameters comprise a height difference and the total moving distance experienced by the electronic apparatus when drawing the second spatial pattern, and the processor is configured for:

calculating a height difference grade based on the height difference and the total moving distance;

calculating a number of steps for connecting the at least one vertex in one single stroke based on a number of the at least one vertex and a number of the at least one region and deducing the difficulty of the first spatial pattern according to the number of steps; and

calculating the complexity by summing the height difference grade and the difficulty.

13. The electronic apparatus according to claim 8, wherein the processor is further configured for correcting the grade by adding the complexity multiplied by a weight to the grade.

14. The electronic apparatus according to claim 8, wherein the processor-is configured for:

calculating the grade by summing the total moving distance multiplied by a first weight, the average speed multiplied by a second weight and the similarity multiplied by a third weight.

15. A system for grading spatial painting, comprising:

a smart apparatus, generating a first spatial pattern;

a wearable apparatus, connected to the smart apparatus, and configured for recording a moving trace and a plurality of moving parameters of the wearable apparatus and transmitting the moving trace and the moving parameters back to the smart apparatus, wherein the moving parameters comprise a total moving distance and an average speed,

wherein the smart apparatus transforms the moving trace recorded by the wearable apparatus into a second spatial pattern, calculates a complexity for completing the second spatial pattern according to the moving parameters of the wearable apparatus and a difficulty of the first spatial pattern, calculates a similarity between the first spatial pattern and the second spatial pattern, and calculates a grade for completing the second spatial pattern according to the moving parameters and the similarity.

16. The system according to claim 15, wherein the wearable apparatus is configured for:

starting recording a plurality of coordinates of the wearable apparatus based on a sampling period in response to a start operation, wherein the coordinates form the motiving trace;

stopping recording the coordinates of the wearable apparatus in response to a stop operation;

wherein the smart apparatus is configured for;

calculating the total moving distance moved by the wearable apparatus during a period from the start operation to the stop operation according to the coordinates and calculating the average speed of the wearable apparatus during the period according to the total moving distance; and

connecting the coordinates to generate the second spatial pattern.

17. The system according to claim 15, wherein the smart apparatus is configured for:

scaling the first spatial pattern into a third spatial pattern and mapping the third spatial pattern to a two-dimensional space;

mapping the second spatial pattern to the two-dimensional space and aligning the second spatial pattern and the third spatial pattern in the two-dimensional space;

creating a plurality of reference lines in the two-dimensional space;

locating a plurality of first reference points on the reference lines intersecting the second spatial pattern and locating a plurality of second reference points on the reference lines intersecting the third spatial pattern;

respectively sorting the first reference points and the second reference points corresponding to an i-th reference line among the reference lines, wherein a number of the first reference points corresponding to the i-th reference line is a first number, and a number of the second reference points corresponding to the i-th reference line is a second number, wherein i is a positive integer;

calculating a distance between a j-th first reference point and a j-th second reference point, wherein j is an integer not greater than a third number, and the third number is a smaller one among the first number and the second number; and

calculating the similarity according to the distance and an area of the third spatial pattern.

18. The system according to claim 17, wherein the smart apparatus is configured for:

calculating a ratio between a first area of the first spatial pattern and a second area of the second spatial pattern, wherein the ratio is greater than 1;

scaling up the first spatial pattern into the third spatial pattern according to the ratio;

mapping the third spatial pattern to the two-dimensional space and setting a center of mass of the third spatial pattern as an origin point of the two-dimensional space;

mapping the second spatial pattern to the two-dimensional space and moving the second spatial pattern so a center of mass thereof is located at the origin point; and

rotating the second spatial pattern to maximize an overlapping area between the second spatial pattern and the third spatial pattern.

19. The system according to claim 15, wherein the first spatial pattern is a two-dimensional pattern having at least one vertex and at least one region, the moving parameters comprise a height difference and the total moving distance experienced by the wearable apparatus when drawing the second spatial pattern, and the smart apparatus is configured for:

calculating a height difference grade based on the height difference and the total moving distance;

calculating a number of steps for connecting the at least one vertex in one single stroke based on a number of the at least one vertex and a number of the at least one region and deducing the difficulty of the first spatial pattern according to the number of steps; and

calculating the complexity by summing the height difference grade and the difficulty.

20. The system according to claim 15, wherein the smart apparatus is further configured for correcting the grade by adding the complexity multiplied by a weight to the grade.

21. The system according to claim 15, wherein the smart apparatus is configured for:

calculating the grade by summing the total moving distance multiplied by a first weight, the average speed multiplied by a second weight and the similarity multiplied by a third weight.