Impedance spectrometer with metamaterial radiative filter
First Claim
1. An impedance spectrometer for sensing a wave impedance of a material, the impedance spectrometer comprising an interrogator adapted for controlling and processing RF signals communicating with a sensing structure, the sensing structure further comprising:
- a first transponder, wherein the first transponder generates a source analog signal responding to an RF control signal communicated from the interrogator by wired or wireless operative coupling;
a metamaterial resonant filter (MRF) receiving the source analog signal from the first transponder and generating a response analog signal affected by MRF coupling into the material, wherein the MRF coupling comprises at least one of an electric, electromagnetic, or magnetic field, and the MRF is operational with at least one of negative permittivity or negative permeability within the MRF;
a second transponder, receiving the response analog signal from the MRF, wherein the level of the response analog signal is communicated to the interrogator via RF signals through a wired or wireless operative coupling, andthe interrogator is further comprised of;
an impedance calculator, wherein the impedance calculator determines the real part and/or the imaginary part of the wave impedance of the material based on one or more sensing operations, wherein each sensing operation provides a measure of the difference in signal levels between the source analog signal and the response signal level at a controlled frequency.
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Abstract
A system and method for sensing the wave impedance of a material using an RF power source with a sensor structure comprised of a metamaterial radiative filter (MRF). The wave impedance is specified or monitored by processing a differential RF signal level with an impedance calculator. The differential RF signal level is obtained from a reference source signal and a response signal. RF field-coupling of the RF source with the material effects the response signal level. In embodiments, the spectrometer is physically configured for noninvasive and invasive measurements. In embodiments, the material is sensed when shielded by RF-opaque media. In embodiments, wherein the MRF has a fixed response characteristic, the dielectric constant may be obtained with a sensing structure comprised of two transponders and a single RF frequency. In embodiments wherein the MRF has a fixed response characteristic, both the dielectric constant and the loss tangent may be obtained using three transponders and a single RF frequency. In embodiments wherein the MRF is tuned with programmed control, both the dielectric constant and the loss tangent may be obtained using two transponders and a single RF frequency.
25 Citations
20 Claims
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1. An impedance spectrometer for sensing a wave impedance of a material, the impedance spectrometer comprising an interrogator adapted for controlling and processing RF signals communicating with a sensing structure, the sensing structure further comprising:
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a first transponder, wherein the first transponder generates a source analog signal responding to an RF control signal communicated from the interrogator by wired or wireless operative coupling; a metamaterial resonant filter (MRF) receiving the source analog signal from the first transponder and generating a response analog signal affected by MRF coupling into the material, wherein the MRF coupling comprises at least one of an electric, electromagnetic, or magnetic field, and the MRF is operational with at least one of negative permittivity or negative permeability within the MRF; a second transponder, receiving the response analog signal from the MRF, wherein the level of the response analog signal is communicated to the interrogator via RF signals through a wired or wireless operative coupling, and the interrogator is further comprised of; an impedance calculator, wherein the impedance calculator determines the real part and/or the imaginary part of the wave impedance of the material based on one or more sensing operations, wherein each sensing operation provides a measure of the difference in signal levels between the source analog signal and the response signal level at a controlled frequency. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A method for sensing a wave impedance of a material, the method comprising:
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performing one or more sensing operations controlled by a controller, wherein each sensing operation comprises transmitting a first analog signal from a first transponder into a metamaterial resonant filter (MRF) and the MRF transmitting a second analog signal into a second transponder in response to the first analog signal, wherein each sensing operation determines a signal level for the first and second analog signals and the signals within each sensing operation have the same frequency; generation of a coupling by the MRF into the material, the coupling comprising at least one of an electric, electromagnetic, or magnetic field, wherein said coupling into the material affects the electrical impedance of the MRF; calculating, by the controller, a difference level for the first and second analog signals for each sensing operation; calculating the real part of the wave impedance of the material based on the difference level obtained for the one or more sensing operations wherein the real part of the wave impedance of the material is uniquely related to the resonant frequency of the MRF; calculating the imaginary part of the wave impedance of the material based on multiple sensing operations obtained over a frequency range that encompasses the resonance frequency of the affected MRF, wherein the imaginary part of the wave impedance is uniquely related to the difference level at the MRF resonance frequency. - View Dependent Claims (20)
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Specification