Pipeline crack detection

• US 10,557,831 B2
• Filed: 07/25/2018
• Issued: 02/11/2020
• Est. Priority Date: 10/01/2015
• Status: Active Grant

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Giese, Jochen Uwe, Robinson, Andrew, Blust, Markus Holger, Goldmann, Christian Alexander
• Primary Examiner(s): Kwok, Helen C
• Application Number:
  US16/044,803
• Publication Number:
  US 20180328891A1
• Time in Patent Office: 566 Days
• CPC Class Codes: F16L 2101/30 Inspecting, measuring or testing
• CPC Class Codes: F16L 55/26 Pigs or moles, i.e. devices movable in a pipe or conduit with or without self-contained propulsion means
• CPC Class Codes: G01N 2291/0289 Internal structure, e.g. defects, grain size, texture
• CPC Class Codes: G01N 2291/044 Internal reflections (echoes), e.g. on walls or defects
• CPC Class Codes: G01N 2291/105 two or more emitters, two or more receivers
• CPC Class Codes: G01N 2291/2634 cylindrical from outside
• CPC Class Codes: G01N 2291/2636 cylindrical from inside
• CPC Class Codes: G01N 29/0609 Display arrangements, e.g. colour displays indicating or recording in connection with measuring in general G01D
• CPC Class Codes: G01N 29/0645 Display representation or displayed parameters, e.g. A-, B- or C-Scan
• CPC Class Codes: G01N 29/069 Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
• CPC Class Codes: G01N 29/07 by measuring propagation velocity or propagation time of acoustic waves
• CPC Class Codes: G01N 29/11 by measuring attenuation of acoustic waves
• CPC Class Codes: G01N 29/225 Supports, positioning or alignment in moving situation
• CPC Class Codes: G01N 29/265 by moving the sensor relative to a stationary material
• CPC Class Codes: G01N 29/38 by time filtering, e.g. using time gates
• CPC Class Codes: G01N 29/4436 with a reference signal amplitude comparison G01N29/48

Abstract

A method includes emitting an ultrasonic signal into a test specimen from a transducer, receiving a first reflected ultrasonic signal from the test specimen, wherein the first reflected ultrasonic signal is reflected from a feature in the test specimen and the first reflected ultrasonic signal is internally reflected within the test specimen three times prior to being received, and determining a threshold depth of the feature in the test specimen based on receiving the first reflected ultrasonic signal.

Claims

1. A method, comprising:

emitting an ultrasonic signal into a test specimen from a sensor carrier module, wherein the sensor carrier module includes a phased array of sensors and the ultrasonic signal is emitted by a first sensor of the phased array of sensors;

receiving a first reflected ultrasonic signal from the test specimen by a second sensor of the phased array of sensors, wherein the first reflected ultrasonic signal is reflected from a feature in the test specimen;

defining a half-skip coverage area, wherein the first coverage area returns a half-skip echo of the first reflected ultrasonic signal as a result of the feature extending into the half-skip coverage area;

defining a one-skip coverage area, wherein the one-skip coverage area returns a one-skip echo of the first reflected ultrasonic signal as a result of the feature extending into the one-skip coverage area;

defining a one-and-a-half-skip coverage area, wherein the one-and-a-half-skip coverage area returns a one-and-a-half-skip echo of the first reflected ultrasonic signal as a result of the feature extending into the one-and-a-half-skip coverage area;

determining the feature extends into the half-skip coverage area of the test specimen based on receiving the half-skip echo of the first reflected ultrasonic signal, wherein the half-skip echo is a first reflection of the first reflected ultrasonic signal and is internally reflected within the test specimen one time;

determining the feature extends into the one-skip coverage area of the test specimen based on receiving the one-skip echo of the first reflected ultrasonic signal, wherein the one-skip echo is a second reflection of the first reflected ultrasonic signal and is internally reflected within the test specimen three times;

determining the feature extends into the one-and-a-half-skip coverage area of the test specimen based on receiving the one-and-a-half-skip echo of the first reflected ultrasonic signal, wherein the one-and-a-half-skip echo is a third reflection of the first reflected ultrasonic signal and is internally reflected within the test specimen five times; and

determining a threshold depth of the feature in the test specimen based on determining the feature extends into the half-skip coverage area, the one-skip coverage area, the one-and-a-half-skip coverage area, or a combination thereof.

2. The method of claim 1, wherein the test specimen is a section of pipe.

3. The method of claim 2, wherein the feature is a notch or a crack extending from an exterior wall of the section of pipe.

4. The method of claim 2, wherein the feature is a notch or a crack extending from an interior wall of the section of pipe.

5. The method of claim 1, wherein the threshold depth is determined to be greater than a predetermined threshold based only on receiving the first reflected ultrasonic signal.

6. The method of claim 5, wherein the predetermined threshold is based on a thickness of the test specimen, a width of a second sensor in the phased array of sensors, an incidence angle of the emitted ultrasonic signal to the test specimen, and a propagation angle of the ultrasonic signal within the test specimen.

7. The method of claim 1, comprising:

receiving, by a second sensor of the phased array of sensors, a second reflected ultrasonic signal that is internally reflected once within the test specimen and reflected from the feature; and

determining the threshold depth of the feature based on receiving the first and second reflected ultrasonic signals.

8. The method of claim 7, comprising:

receiving, by a third sensor of the phased array of sensors, a third reflected ultrasonic signal that is internally reflected five times within the test specimen and reflected from the feature; and

determining the threshold depth based on receiving the first, second, and third reflected ultrasonic signals.

9. The method of claim 7, comprising:

receiving, by the second sensor of the phased array of sensors, a third reflected ultrasonic signal that is internally reflected five times within the test specimen and reflected from the feature; and

determining the threshold depth based on receiving the first and third reflected ultrasonic signals.

10. The method of claim 1, wherein the phased array of sensors includes two or more of ultrasonic sensors, piezo ultrasonic sensors, piezocomposite ultrasonic sensors, electromagnetic acoustic sensors, and magnetic flux sensors.

11. A system comprising:

a processor, where in the processor is configured to

emit an ultrasonic signal into a test specimen from a sensor carrier module, wherein the sensor carrier module includes a phased array of sensors and the ultrasonic signal is emitted by a first sensor of the phased array of sensors;

receive a first reflected ultrasonic signal from the test specimen by a second sensor of the phased array of sensors, wherein the first reflected ultrasonic signal is reflected from a feature in the test specimen;

define a half-skip coverage area, wherein the first coverage area returns a half-skip echo of the first reflected ultrasonic signal as a result of the feature extending into the half-skip coverage area;

define a one-skip coverage area, wherein the one-skip coverage area returns a one-skip echo of the first reflected ultrasonic signal as a result of the feature extending into the one-skip coverage area;

define a one-and-a-half-skip coverage area, wherein the one-and-a-half-skip coverage area returns a one-and-a-half-skip echo of the first reflected ultrasonic signal as a result of the feature extending into the one-and-a-half-skip coverage area;

determine the feature extends into the half-skip coverage area of the test specimen based on receiving the half-skip echo of the first reflected ultrasonic signal, wherein the half-skip echo is a first reflection of the first reflected ultrasonic signal and is internally reflected within the test specimen one time;

determine the feature extends into the one-skip coverage area of the test specimen based on receiving the one-skip echo of the first reflected ultrasonic signal, wherein the one-skip echo is a second reflection of the first reflected ultrasonic signal and is internally reflected within the test specimen three times;

determine the feature extends into the one-and-a-half-skip coverage area of the test specimen based on receiving the one-and-a-half-skip echo of the first reflected ultrasonic signal, wherein the one-and-a-half-skip echo is a third reflection of the first reflected ultrasonic signal and is internally reflected within the test specimen five times; and

determine a threshold depth of the feature in the test specimen based upon determining the feature extends into the half-skip coverage area, the one-skip coverage area, the one-and-a-half-skip coverage area, or a combination thereof.

12. The system of claim 11, wherein the processor is further configured to determine the threshold depth of the feature in the test specimen based upon the first reflected ultrasonic signal and a second reflected ultrasonic signal received from the test specimen, by a third sensor in the phased array of sensors, wherein the second reflected ultrasonic signal was reflected from the feature and internally reflected within the test specimen once prior to being received.

13. The system of claim 12, wherein the processor is further configured to determine, in response to an ultrasonic signal focused externally with respect to a surface of a test specimen and emitted by a fourth sensor in the phased array of sensors, the threshold depth of the feature in the test specimen based upon the first reflected ultrasonic signal and a third reflected ultrasonic signal received from the test specimen, by a fifth sensor in the phased array of sensors, wherein the third reflected ultrasonic signal was reflected from the feature and externally reflected with respect to the test specimen five times prior to being received.

14. The system of claim 11, wherein the feature is a notch or a crack extending from an exterior wall of the test specimen.

15. The system of claim 11, wherein the threshold depth is determined to be greater than a predetermined threshold based on the first reflected ultrasonic signal.

16. The system of claim 12, wherein the predetermined threshold is based on a thickness of the test specimen, a width of a second sensor in the phased array of sensors, an incidence angle of the emitted ultrasonic signal to the test specimen, and a propagation angle of the ultrasonic signal within the test specimen.

17. The system of claim 15, wherein the threshold depth of the feature is determined irrespective of an amplitude of the first reflected ultrasonic signal.

18. A system comprising:

a processor;

and

a display;

wherein the system is configured to;

emit an ultrasonic signal into a test specimen from a sensor carrier module, wherein the sensor carrier module includes a phased array of sensors and the ultrasonic signal is emitted by a first sensor of the phased array of sensors;

receive a first reflected ultrasonic signal from the test specimen by a second sensor of the phased array of sensors, wherein the first reflected ultrasonic signal is reflected from a feature in the test specimen;

define a half-skip coverage area, wherein the first coverage area returns a half-skip echo of the first reflected ultrasonic signal as a result of the feature extending into the half-skip coverage area;

define a one-skip coverage area, wherein the one-skip coverage area returns a one-skip echo of the first reflected ultrasonic signal as a result of the feature extending into the one-skip coverage area;

define a one-and-a-half-skip coverage area, wherein the one-and-a-half-skip coverage area returns a one-and-a-half-skip echo of the first reflected ultrasonic signal as a result of the feature extending into the one-and-a-half-skip coverage area;

determine the feature extends into the half-skip coverage area of the test specimen based on receiving the half-skip echo of the first reflected ultrasonic signal, wherein the half-skip echo is a first reflection of the first reflected ultrasonic signal and is internally reflected within the test specimen one time;

determine the feature extends into the one-skip coverage area of the test specimen based on receiving the one-skip echo of the first reflected ultrasonic signal, wherein the one-skip echo is a second reflection of the first reflected ultrasonic signal and is internally reflected within the test specimen three times;

determine the feature extends into the one-and-a-half-skip coverage area of the test specimen based on receiving the one-and-a-half-skip echo of the first reflected ultrasonic signal, wherein the one-and-a-half-skip echo is a third reflection of the first reflected ultrasonic signal and is internally reflected within the test specimen five times;

determine a threshold depth of a feature in the test specimen based upon determining the feature extends into the half-skip coverage area, the one-skip coverage area, the one-and-a-half-skip coverage area, or a combination thereof; and

provide the determined threshold depth within the display.

19. The system of claim 18, wherein the system is configured to determine the threshold depth of the feature in the test specimen based upon the first reflected ultrasonic signal and a second reflected ultrasonic signal received from the test specimen, by a third sensor in the phased array of sensors, wherein the second reflected ultrasonic signal was reflected from the feature and internally reflected within the test specimen once prior to being received.

20. The system of claim 18, wherein the phased array of sensors includes two or more of ultrasonic sensors, piezo ultrasonic sensors, piezocomposite ultrasonic sensors, electromagnetic acoustic sensors, and magnetic flux sensors.