Dual circuit current loading analysis apparatus

• US 10,677,818 B1
• Filed: 06/19/2018
• Issued: 06/09/2020
• Est. Priority Date: 06/19/2017
• Status: Active Grant

• Current Assignee: Cardell Damian Webster
• Original Assignee: Cardell Damian Webster
• Inventors: Webster, Cardell Damian
• Primary Examiner(s): Nguyen, Hoai-An D.
• Application Number:
  US16/012,581
• Time in Patent Office: 721 Days
• Field of Search: 324 7611, 324 98, 324 99 R, 324 99 D, 324500, 324503, 324508, 324509, 324512, 324522, 324600, 324649, 324691, 324713, 324715, 324718, 702 1, 702 57, 702 64
• CPC Class Codes: G01D 11/24 Housings ; Casings for instruments
• CPC Class Codes: G01R 1/04 Housings; Supporting members; Arrangements of terminals
• CPC Class Codes: G01R 13/02 for displaying measured electric variables in digital form
• CPC Class Codes: G01R 15/125 for digital multimeters
• CPC Class Codes: G01R 19/25 using digital measurement techniques
• CPC Class Codes: G01R 31/006 on road vehicles, e.g. automobiles or trucks testing of ignition installations peculiar to internal combustion engines F02P17/00
• CPC Class Codes: G01R 31/56 Testing of electric apparatus testing of transformers G01R31/62; testing of connections G01R31/66

Abstract

A dual circuit current loading analysis apparatus enables the efficient testing of an electrical circuit, particularly those in vehicular applications. The apparatus electrically loads two circuits simultaneously and compares those readings to a battery or power source. Circuit input ports and ports to attach to the positive and negative sides of the battery are provided and attached to a microcontroller, voltage measurement device and load test device. The results of the test are indicated on a display and LEDs.

Claims

1. A dual circuit current loading analysis apparatus comprising:

a housing that encloses an inner compartment, the housing having four sidewalls including a first sidewall, a second sidewall, a front wall and a back wall;

a microcontroller disposed within the inner compartment;

a voltage measurement device separate from the microcontroller; and

a circuit load device disposed within the inner compartment and separate from the microcontroller;

a positive battery port and a negative battery port attached to the first sidewall of the housing and are conductively coupled to the voltage measurement device and the circuit load device;

a first circuit input port and a second circuit input port attached to the second sidewall of the housing, the first circuit input port and the second input port are conductively coupled to both the voltage measurement device and the circuit load device; and

a numerical display and LEDs disposed within the, inner compartment, the numerical display and the LEDs are conductively coupled to the microcontroller;

wherein the device simulates an electrical load between the power source and at least two electrical circuits simultaneously to be tested and the results are indicated by the digital display and LEDs.

2. A method of analyzing a circuit comprising:

providing the apparatus of claim 1;

connecting the battery or power source to the battery ports;

connecting the circuits to be tested to the circuit input ports;

allowing the apparatus to electrically load the circuits to the component or in place of the component comparing the readings to the battery; and

interpreting the results indicated by the digital display and LEDs.