Contact force testing apparatus, use of such a contact force testing apparatus and method for producing such a contact force testing apparatus

• US 10,753,810 B2
• Filed: 04/22/2016
• Issued: 08/25/2020
• Est. Priority Date: 04/30/2015
• Status: Active Grant

• Current Assignee: Kistler Holding AG
• Original Assignee: Kistler Holding AG
• Inventors: Mastrogiacomo, Giovanni, Brandenberger, Sandro, Furter, Paul, Staub, Reinhard, Thiel, Rolf, Cavalloni, Claudio
• Primary Examiner(s): Tran, Tran M.
• Application Number:
  US15/565,335
• Publication Number:
  US 20180113033A1
• Time in Patent Office: 1,586 Days
• CPC Class Codes: G01L 1/16 using properties of piezoelectric devices
• CPC Class Codes: G01L 5/0057 measuring forces due to spring-shaped elements

Abstract

A contact force testing apparatus includes a measuring sensor that can be contacted with an electrical contact element and measures a contact force (F) of a contact with the electrical contact element of an electrical connector having a male component and a female component. The measuring sensor receives the contact force in a contact region with a piezoelectric pick-up. The measuring sensor includes a plurality of piezoelectric pick-ups that are spaced apart from one another by pick-up gaps. The measuring sensor has a protective sleeve that covers the piezoelectric pick-ups and the pick-up gaps in the contact region.

Claims

1. A testing apparatus for measuring a contact force applied by a female electrical contact element of a female electrical connector, which is configured for effecting electrical connection with a male electrical contact element, the apparatus comprising:

a measuring sensor having a contact region configured for being disposed in contact with the female electrical contact element of the female electrical connector when the measuring sensor is inserted into the female electrical connector in place of the male electrical contact element, the measuring sensor including a plurality of piezoelectric pick-ups disposed in the contact region, each of the plurality of piezoelectric pick-ups including piezoelectric material;

each of the plurality of piezoelectric pick-ups being disposed-spaced apart from one another by a respective one of a plurality of pick-up gaps; and

a protective sleeve made of electrically conducting material that covers the plurality of piezoelectric pick-ups and the plurality of pick-up gaps in the contact region and wherein the protective sleeve is configured to be disposable between the female electrical contact element and the plurality of piezoelectric pick-ups when the measuring sensor is inserted into the female electrical connector.

2. The contact force testing apparatus according to claim 1, wherein piezoelectric pick-ups are arranged rotationally offset with respect to one another about a central axis of the measuring sensor;

and that the protective sleeve completely covers from the outside the piezoelectric pick-ups and the pick-up gaps with respect to the central axis in the contact region.

3. The contact force testing apparatus according to claim 1, wherein the protective sleeve abuts non-positively against the piezoelectric pick-ups in the contact region.

4. The contact force testing apparatus according to claim 1, wherein the measuring sensor has a base plate which is disposed in the direction of an elongate extension of the measuring sensor;

and that the piezoelectric pick-ups are connected mechanically to the base plate.

5. The contact force testing apparatus according to claim 4, wherein each piezoelectric pick-up has a first layer of piezoelectric material which is connected in the contact region via a side facing the central axis to the base plate;

that each piezoelectric pick-up has an acceptor electrode which is connected in the contact region via a side facing the central axis to the first layer of piezoelectric material;

that each piezoelectric pick-up has a second layer of piezoelectric material which is connected in the contact region via a side facing the central axis to the acceptor electrode;

that each piezoelectric pick-up has a cover plate which is connected in the contact region via a side facing the central axis to the second layer of piezoelectric material.

6. The contact force testing apparatus according to claim 5, wherein the first layer of piezoelectric material has a first metallization on a side facing away from the central axis;

that an electrical conductor is connected electrically to the first metallization; and

that the protective sleeve completely covers this electrical connection from the outside with respect to the central axis.

7. The contact force testing apparatus according to claim 5, wherein an outer side of the cover plate facing away from the central axis is convexly shaped in the contact region;

that the protective sleeve is circularly symmetrical in the contact region; and

that a radius of curvature of the outer side of the cover plate is less than or equal to an inner radius of the protective sleeve.

8. The contact force testing apparatus according to claim 1, wherein the protective sleeve has a thickness of less than or equal to 50 μ

m, in the contact region.

9. The contact force testing apparatus according to claim 1, wherein the measuring sensor has a protective cap in a front region;

that the measuring sensor has a support in a rear region;

that the protective sleeve abuts flush against the protective cap in the front region of the measuring sensor; and

that the protective sleeve is connected in a firmly bonded manner to the support in the rear region of the measuring sensor.

10. The contact force testing apparatus according to claim 1, wherein due to its mechanical extension, the protective sleeve prevents the penetration of impurities into the measuring sensor.

11. The contact force testing apparatus according to claim 1, wherein due to its mechanical extension, the protective sleeve forms an electrical shielding of the measuring sensor.

12. The contact force testing apparatus according to claim 1, wherein the protective sleeve abuts directly against the electrical contact element upon contact of the measuring sensor with the electrical contact element.

13. An apparatus according to claim 1, wherein each of the piezoelectric pickups is arranged symmetrically rotationally offset by a rotational offset angle from each other one the piezoelectric pickups, which rotational offset angle is obtained from the angular magnitude of the full circle of 360°

divided by the number of piezoelectric pickups.

14. An apparatus according to claim 13, wherein each of the plurality of pick-up gaps in the contact region is devoid of solid material.

15. An apparatus according to claim 1, wherein the contact region is defined within a cylindrical region formed about a central axis, and wherein each of the plurality of piezoelectric pick-ups is disposed within the cylindrical region.

16. An apparatus according to claim 1, wherein a first one of the plurality of piezoelectric pick-ups defines a clockwise side disposed facing toward a clockwise direction around the circumferential direction within the cylindrical region, wherein a second one of the plurality of piezoelectric pick-ups is disposed nearest to the clockwise side and spaced apart from the first one of the plurality of piezoelectric pick-ups by one of the plurality of pick-up gaps, which is devoid of solid material.