Porous mesh spectrometry methods and apparatus
First Claim
1. A method of measuring spectra of a sample, the method comprising:
- adding an internal standard to the sample at a known concentration;
depositing, after adding the internal standard to the sample, the sample onto a measurement surface of an optical waveguide, the measurement surface having a porous mesh disposed thereover, and the porous mesh comprising a plurality of pores to receive a portion of the sample therein; and
measuring the portion of the sample disposed within the plurality of pores and in contact with the measurement surface with an evanescent wave generated at the measurement surface from total internal reflection of measurement light within the optical waveguide.
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Accused Products
Abstract
Described herein are methods and apparatus for spectroscopic analysis of samples. In many embodiments, an apparatus for providing spectroscopic analysis of a sample comprises a sample holder. For example, the sample holder may comprise a consumable single use sample holder that can be readily coupled to and removed from a measurement apparatus such as a spectrometer. The sample holder may comprise a measurement surface configured to receive the sample during measurement, wherein the measurement surface may comprise a porous mesh. The porous mesh can receive the sample to optimally configure the sample for spectroscopic measurement, as described in further detail herein.
153 Citations
20 Claims
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1. A method of measuring spectra of a sample, the method comprising:
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adding an internal standard to the sample at a known concentration; depositing, after adding the internal standard to the sample, the sample onto a measurement surface of an optical waveguide, the measurement surface having a porous mesh disposed thereover, and the porous mesh comprising a plurality of pores to receive a portion of the sample therein; and measuring the portion of the sample disposed within the plurality of pores and in contact with the measurement surface with an evanescent wave generated at the measurement surface from total internal reflection of measurement light within the optical waveguide. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification