Backlight test circuit, backlight test method and backlight module using the same

  • US 10,782,335 B2
  • Filed: 04/12/2018
  • Issued: 09/22/2020
  • Est. Priority Date: 11/06/2017
  • Status: Active Grant
First Claim
Patent Images

1. A backlight test method, adapted to a backlight test circuit comprising N circuit blocks, wherein each circuit block includes M mini-LED circuits, each mini-LED circuit includes L mini-LEDs and a switching circuit, the L mini-LEDs are connected in parallel or in serial as a mini-LED set, the switching circuit controls the turning on and the turning off of the mini-LED set according to a control signal, and N, M and L are positive integers, comprising:

  • providing a voltage source signal to each circuit block;

    providing a control signal to switching circuits of each circuit block;

    within each time segment, setting only one voltage source signal at a high level, and turning on the switching circuit of only one mini-LED circuit of the circuit block having the voltage source signal at a high level;

    detecting an output voltage and an output current of the backlight test circuit; and

    calculating an output impedance according to the output voltage and the output current of the backlight test circuit, wherein the mini-LED circuit is determined to be abnormal when the output impedance is beyond a predetermined impedance range.

View all claims
    ×
    ×

    Thank you for your feedback

    ×
    ×