Multispectral thermal imaging for detection of materials of interest
First Claim
Patent Images
1. A method comprising:
- receiving a test sample;
conductively heating the test sample to emit thermal infrared radiation from at least a portion of the test sample over a plurality of thermal infrared radiation wavelengths without decomposing the portion of the test sample into a vapor;
capturing, by an infrared imager, a plurality of thermal infrared images of the portion of the test sample, wherein each infrared image corresponds to a different range of the thermal infrared radiation wavelengths;
determining, by a processor, a thermal spectral profile of the test sample using the thermal infrared images, wherein the thermal spectral profile comprises a plurality of responses of the test sample provided in the thermal infrared images for the different ranges of the thermal infrared radiation wavelengths;
comparing, by the processor, the determined thermal spectral profile to a known thermal spectral profile of a material of interest; and
determining, by the processor, whether the material is present in the test sample based on the comparing.
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Abstract
Imaging techniques are provided to determine the presence of trace chemicals corresponding to various materials of interest. In one example, a method includes receiving a test sample and capturing a plurality of infrared images of the test sample. Each infrared image corresponds to a different range of infrared radiation wavelengths. The method also includes determining a spectral profile of the test sample using the infrared images, comparing the determined spectral profile to a known spectral profile of a material of interest, and determining whether the material is present in the test sample based on the comparing. Additional methods and related devices are also provided.
32 Citations
20 Claims
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1. A method comprising:
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receiving a test sample; conductively heating the test sample to emit thermal infrared radiation from at least a portion of the test sample over a plurality of thermal infrared radiation wavelengths without decomposing the portion of the test sample into a vapor; capturing, by an infrared imager, a plurality of thermal infrared images of the portion of the test sample, wherein each infrared image corresponds to a different range of the thermal infrared radiation wavelengths; determining, by a processor, a thermal spectral profile of the test sample using the thermal infrared images, wherein the thermal spectral profile comprises a plurality of responses of the test sample provided in the thermal infrared images for the different ranges of the thermal infrared radiation wavelengths; comparing, by the processor, the determined thermal spectral profile to a known thermal spectral profile of a material of interest; and determining, by the processor, whether the material is present in the test sample based on the comparing. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A device comprising:
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a chamber configured to receive a test sample; a heater configured to conductive heat the test sample to emit thermal infrared radiation from at least a portion of the test sample over a plurality of thermal infrared radiation wavelengths without decomposing the portion of the test sample into a vapor; an infrared imager configured to capture a plurality of thermal infrared images of the portion of the test sample, wherein each infrared image corresponds to a different range of the thermal infrared radiation wavelengths; a plurality of filters associated with the different ranges of the thermal infrared radiation wavelengths and configured to be positioned between the test sample and the infrared imager during the capture; a memory comprising instructions; and a processor configured to execute the instructions to; determine a thermal spectral profile of the test sample using the thermal infrared images, wherein the thermal spectral profile comprises a plurality of responses of the test sample provided in the thermal infrared images for the different ranges of the thermal infrared radiation wavelengths, compare the determined thermal spectral profile to a known thermal spectral profile of a material of interest, and determine whether the material is present in the test sample based on the compared thermal spectral profiles. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification