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System and method for picking validation

  • US 10,810,715 B2
  • Filed: 09/25/2015
  • Issued: 10/20/2020
  • Est. Priority Date: 10/10/2014
  • Status: Active Grant
First Claim
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1. A method for validating a picking operation, the method comprising:

  • picking an item;

    placing the picked item on a platform in a field of view of a dimensioning system communicatively coupled to a computing device, wherein the platform is supported by a powered-industrial vehicle;

    sensing, using a sensor, a first set of physical attributes of the picked item, wherein the sensor comprises the dimensioning system, a scale, and a digital camera, wherein the sensing is comprised of sensing, using the dimensioning system, dimensions of the picked item while the picked item is on the platform in the field of view of the dimensioning system, wherein at least a portion of the dimensioning system is supported by the powered-industrial vehicle at a higher elevation than the platform so that the field of view of the dimensioning system is directed downwardly toward the platform and multiple sides of the picked item are in the field of view of the dimensioning system, and wherein at least a portion of the digital camera is supported by the powered-industrial vehicle at a higher elevation than the platform so that a field of view of the digital camera is directed downwardly toward the platform;

    comparing, using the computing device, the first set of sensed-physical attributes to expected-physical attributes stored on the computing device, wherein the comparing is comprised of comparing, using the computing device, the sensed dimensions of the picked item to expected dimensions of the picked item stored on the computing device; and

    in response to the first set of sensed-physical attributes not matching the expected-physical attributes;

    generating a picking-error alert, comprising generating the picking-error alert if the sensed dimensions of the picked item do not match the expected dimensions of the picked item, andupdating, in the computing device, the expected-physical attributes based on the first set of sensed-physical attributes and a second set of sensed-physical attributes collected at a different time during a different picking operation.

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