×

Input parasitic metal detection

  • US 10,862,335 B2
  • Filed: 11/14/2016
  • Issued: 12/08/2020
  • Est. Priority Date: 02/08/2010
  • Status: Active Grant
First Claim
Patent Images

1. A method of detecting an unacceptable amount of parasitic metal in proximity to a primary device, the method comprising:

  • transferring contactless energy at a first power level from a primary device to a secondary device;

    measuring one or more first characteristics of power in the primary device to obtain a first value, wherein the first value is representative of the amount of power transferred from the primary device;

    measuring one or more second characteristics of power in the primary device, wherein the one or more second characteristics are indicative of the amount of power transferred from the primary device at the first power level;

    receiving information from the secondary device to obtain a second value, wherein the second value is representative of the amount of power received by the secondary device;

    receiving information from the secondary device about the amount of power received by the secondary device at the first power level;

    transferring contactless energy at a second power level from a primary device to a secondary device;

    measuring one or more third characteristics of power in the primary device, wherein one or more third characteristics are indicative of the amount of power transferred from the primary device at the second power level;

    receiving information from the secondary device about the amount of power received by the secondary device at the second power level; and

    estimating acceptable power loss in at least one of the primary device and the secondary device to obtain a third value,wherein the third value is representative of estimated acceptable power loss,wherein the estimated acceptable power loss varies based on at least one of the amount of power transferred from the primary device and the amount of power received by the secondary device;

    determining whether there is an unacceptable amount of parasitic metal in proximity to the primary device based on the first value, the second value and the third value;

    determining a relationship between a third power level and the acceptable power loss, wherein the relationship is based on the amount of power transferred from the primary device at the first power level, the amount of power received by the secondary device at the first power level, the amount of power transferred from the primary device at the second power level, and the amount of power received by the secondary device at the second power level.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×