Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees

• US 11,506,877 B2
• Filed: 11/10/2017
• Issued: 11/22/2022
• Est. Priority Date: 11/10/2016
• Status: Active Grant

• Current Assignee: Trustees Of Columbia University In The City Of New York (Columbia University)
• Original Assignee: Trustees Of Columbia University In The City Of New York (Columbia University)
• Inventors: Tomer, Raju
• Primary Examiner(s): Dunning, Ryan S
• Application Number:
  US16/347,406
• Publication Number:
  US 20190310451A1
• Time in Patent Office: 1,838 Days
• CPC Class Codes: G01N 21/6458 Fluorescence microscopy fluorescence microscopes per se G02B21/0076 and G02B21/16
• CPC Class Codes: G02B 21/0032 Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers G02B21/0036 - G02B21/008; means for illumination of specimens in general G02B21/06
• CPC Class Codes: G02B 21/0076 arrangements using fluorescence or luminescence
• CPC Class Codes: G02B 21/367 providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
• CPC Class Codes: G02B 2207/113 Fluorescence

Abstract

Light Sheet Theta (LS-0) Microscopy achieves large sample imaging capabilities without affecting the imaging depth or the image quality. An optical layout places a detection objective normal to the sample surface, while placing the illumination objectives that generate light sheets at an angle (theta) significantly smaller than 90 degrees. In this configuration, the light sheets enter from same side of the sample as the detection objective. The intersection of the light-sheet and the detection focal plane results in a line illumination-detection profile that is discriminated by a camera.

Claims

1. An microscope comprising:

an imaging component, with an imaging objective, and a first light sheet projector located on a same side of a sample region;

the imaging objective and first light sheet projector having respective axes that intersect in the sample region at an angle of less than 90 degrees;

a sample support positioned to hold a sample in said sample region;

the first light sheet projector having light scanning and focusing optics to permit the selection of an axial position of a light sheet beam waist and the selection of a position of the light sheet along an axis perpendicular to the light sheet propagation direction;

a controller connected to control the light scanning and focusing optics to translate the beam waist along a linear path;

the imaging objective optical axis being perpendicular to said linear path.

2. The microscope of claim 1, wherein the focusing optics include an electrically tunable lens (ETL).

3. The microscope of claim 1, wherein the sample support is a generally flat element shaped to hold a slab-shaped sample.

4. The microscope of claim 1, further comprising a second light sheet projector with an optical axis forming an angle with said imaging objective optical axis equal to an angle formed by said first light sheet projector optical axis with said imaging objective optical axis.

5. The microscope of claim 1, further comprising one or more further light sheet projectors and an imaging component arranged on an opposite side of the sample region such that two opposite faces of a sample can be scanned.

6. The microscope of claim 1, further comprising a translating stage connected to move said sample support to permit the sequential scanning of portions of a sample.

7. An imaging instrument, comprising:

a microscope with an objective having an optical axis;

a first light beam projector with imaging optics separate from said microscope positioned to direct a beam of light that crosses said optical axis at an angle of less than 90 degrees, wherein the objective and the light beam projector are located on a same side of a sample volume; and

the first light beam projector forming a sheet having a beam waist in the form of a line of maximum intensity;

the first light beam projector having a scanning mechanism that scans the line of maximum intensity through a range of positions along a scan direction perpendicular to the line of maximum intensity.

8. The imaging instrument of claim 7, wherein the microscope objective has an optical axis that is perpendicular to the scan direction.

9. The imaging instrument of claim 7, wherein the objective and the light beam projector are positioned such that an extended slab-shaped sample can be scanned by moving the sample relative to the objective and the light beam projector.

10. The imaging instrument of claim 7, wherein the scanning mechanism scans in two axes, one to change a position of the line of maximum intensity along a length of the sheet in the direction of propagation of the sheet and one to change the position of the line of maximum intensity along an axis perpendicular to the direction of propagation of the sheet.

11. The imaging instrument of claim 7, wherein the angle of less than 90 degrees is as close to 90 degrees as allowed by the geometry.

12. The imaging instrument of claim 7, wherein the angle of less than 90 degrees is between 37.5 and 75 degrees.

13. The imaging instrument of claim 7, further comprising a traversing system connected to one or both of the microscope and a sample support to move them such that a slab-shaped sample can be scanned.

14. The imaging instrument of claim 13, wherein the traversing system is an X-Y traversing system.

15. The imaging instrument of claim 13, wherein the traversing system is an X-Y-Z traversing system, where X and Y axes are parallel to a major plane of the sample volume and the Z axis is perpendicular thereto.

16. The imaging instrument of claim 13, further comprising a controller connected to the traversing system and scanning mechanism to scan each of multiple tile segments of a sample using the scanning mechanism and to shift the sample support relative to the microscope to scan additional tile segment.

17. The imaging instrument of claim 7, wherein the scanning mechanism includes electrically tunable lens (ETL).

18. The imaging instrument of claim 17, wherein the ETL changes a position of the line of maximum intensity along a length of the sheet in the direction of propagation of the sheet.

19. The imaging instrument of claim 18, wherein the scanning mechanism includes a light redirector that scans the sheet such that the line of maximum intensity traverses an axis perpendicular to a direction of propagation of the sheet.

20. The imaging instrument of claim 17, wherein the scanning mechanism includes a light redirector that scans the sheet such that the line of maximum intensity traverses an axis perpendicular to a direction of propagation of the sheet.

21. The imaging instrument of claim 20, wherein the light redirector includes a galvo-motor.