Methods for wireless testing of integrated circuits

• US 20010005145A1
• Filed: 01/16/2001
• Published: 06/28/2001
• Est. Priority Date: 03/23/1998
• Status: Active Grant

• Current Assignee: Skyworks Solutions Incorporated
• Original Assignee: Skyworks Solutions Incorporated
• Inventors: Siann, Jonathan I., Johnston, James W., Henderson, P. Michael, White, Stanley A., Walley, Kenneth S., Hale, Kelly H., Andrews, Warner B. Jr.
• Granted Patent: US 6,686,755 B2
• Time in Patent Office: Days
• US Class Current: 324/765
• CPC Class Codes: G01R 31/2851 Testing of integrated circuits [IC] G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801
• CPC Class Codes: G01R 31/2886 Features relating to contacting the IC under test, e.g. probe heads; chucks G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06
• CPC Class Codes: G01R 31/3025 Wireless interface with the DUT
• CPC Class Codes: G01R 31/303 of integrated circuits G01R31/305 - G01R31/315 take precedence
• CPC Class Codes: G01R 31/315 by inductive methods

Abstract

A system for testing a microelectronic circuit includes a test bed for mounting a microelectronic circuit, and a signal source for applying a signal to a microelectronic circuit mounted on the test bed. The system additionally includes a test probe for wirelessly receiving electromagnetic response signals from the microelectronic circuit mounted on the test bed. In a preferred form, the electromagnetic response signals are radio-frequency signals. The test system additionally includes a computer connected to be test probe for analyzing the electromagnetic response signals. An integrated circuit for testing on the test system has a test circuit portion that emits electromagnetic radiation in response to a predetermined signal applied to the test circuit.

Claims

1. A system for testing a microelectronic circuit, the system comprising:

a signal source for applying a signal to a microelectronic circuit; and

a test probe for wirelessly receiving electromagnetic response signals from said microelectronic circuit mounted on said test bed.

2. The system of

claim 1

, wherein said electromagnetic response signals comprise radio-frequency signals.

3. The system of

claim 1

, wherein said electromagnetic response signals comprise infrared signals.

4. The system of

claim 1

, wherein said electromagnetic response signals comprise coherent optical signals.

5. The system of

claim 1

, additionally comprising a computer connected to said probe for analyzing said electromagnetic response signals received by said probe.

6. The system of

claim 2

, additionally comprising a computer connected to said probe for analyzing said radio-frequency response signals received by said probe.

7. The system of

claim 1

, wherein said signal source additionally wirelessly transmits electromagnetic test signals through said probe to said microelectronic circuit.

8. A test apparatus for testing an integrated circuit, the integrated circuit including a test portion configured to emit electromagnetic radiation in response to a predetermined signal, the test apparatus comprising:

a signal source for applying to said integrated circuit a predetermined signal, such that said signal causes said integrated circuit to emit electromagnetic radiation;

an electromagnetic radiation receiver configured to detect electromagnetic radiation emitted by said integrated circuit; and

a computer connected to said electromagnetic receiver for analyzing said electromagnetic radiation emitted by said integrated circuit.

9. The apparatus of

claim 8

, wherein said electromagnetic radiation is radio frequency radiation.

10. The apparatus of

claim 8

, wherein said electromagnetic radiation is infrared radiation.

11. The apparatus of

claim 8

, wherein said electromagnetic radiation is coherent optical radiation.

12. An integrated circuit designed for testability, said integrated circuit comprising a test circuit portion that emits electromagnetic radiation in response to a predetermined signal applied to said test circuit.

13. The integrated circuit of

claim 12

, wherein electromagnetic radiation is radio frequency radiation.

14. The apparatus of

claim 12

, wherein said electromagnetic radiation is infrared radiation.

15. The apparatus of

claim 12

, wherein said electromagnetic radiation is coherent optical radiation.

16. A combination comprising an integrated circuit and apparatus for testing said integrated circuit, the combination comprising:

an integrated circuit incorporating a test circuit portion, wherein said test circuit portion is configured so that as a first electrical effect is generated in said test circuit portion, said test circuit portion emits electromagnetic radiation; and

a test device comprising;

an electromagnetic radiation receiver for detecting electromagnetic radiation emitted by said test circuit portion of said integrated circuit; and

an analyzer for analyzing electromagnetic radiation detected by said receiver.

17. The integrated circuit and test apparatus combination of

claim 16

, wherein said analyzer analyzes said detected electromagnetic radiation to determine whether said test circuit portion is operating correctly.

18. The integrated circuit and test apparatus combination of

claim 17

, wherein said electromagnetic radiation is radio frequency radiation.

19. The integrated circuit and test apparatus combination of

claim 17

, wherein said electromagnetic radiation is infrared radiation.

20. The integrated circuit and test apparatus combination of

claim 17

, wherein said electromagnetic radiation is coherent optical radiation.

21. A method of testing a semiconductor integrated circuit, the method comprising the steps of:

applying a predetermined signal to an integrated circuit to cause said integrated circuit to emit electromagnetic radiation; and

wirelessly detecting said electromagnetic radiation emitted by said integrated circuit.

22. The testing method of

claim 21

, wherein said electromagnetic radiation emitted by said integrated circuit is radio frequency radiation.

23. The testing method of

claim 22

, wherein said step of wirelessly detecting said electromagnetic radiation comprises placing an electromagnetic radiation receiver near said integrated circuit.

24. The testing method of

claim 22

, wherein said step of wirelessly detecting said electromagnetic radiation comprises placing an electromagnetic radiation receiver within 10 cm of said integrated circuit.

25. The testing method of

claim 22

, wherein said step of wirelessly detecting said electromagnetic radiation comprises placing an electromagnetic receiver with an 3 cm of said integrated circuit.

26. The testing method of

claim 21

, additionally comprising, prior to said step of applying said predetermined signal, the step of designing said electronic circuit so that said electronic circuit includes a test circuit portion that emits electromagnetic radiation in response to a predetermined signal in said test circuit portion applied to said test circuit portion.

27. The method of

claim 21

, additionally comprising the step of analyzing with a programmed electronic computer said wirelessly detected electromagnetic radiation.

28. The testing method of

claim 21

, wherein said electromagnetic radiation emitted by said integrated circuit is infrared radiation.

29. The testing method of

claim 21

, wherein said electromagnetic radiation emitted by said integrated circuit is coherent optical radiation.